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Combining strengths of circuit-based and CNF-based algorithms for a high-performance SAT solver
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 39th annual Design Automation Conference table of contents
New Orleans, Louisiana, USA
SESSION: Advances in SAT table of contents
Pages: 747 - 750  
Year of Publication: 2002
ISBN ~ ISSN:0738-100X , 1-58113-461-4
Authors
Malay K. Ganai  NEC USA CCRL, Princeton NJ
Pranav Ashar  NEC USA CCRL, Princeton NJ
Aarti Gupta  NEC USA CCRL, Princeton NJ
Lintao Zhang  Princeton University
Sharad Malik  Princeton University
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 19,   Downloads (12 Months): 56,   Citation Count: 29
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ABSTRACT

We propose Satisfiability Checking (SAT) techniques that lead to a consistent performance improvement of up to 3x over state-of-the-art SAT solvers like Chaff on important problem domains in VLSI CAD. We observe that in circuit oriented applications like ATPG and verification, different software engineering techniques are required for the portions of the formula corresponding to learnt clauses compared to the original formula. We demonstrate that by employing the same innovations as in advanced CNF-based SAT solvers, but in a hybrid approach where these two portions of the formula are represented differently and processed separately, it is possible to obtain the consistently highest performing SAT solver for circuit oriented problem domains. We also present controlled experiments to highlight where these gains come from. Once it is established that the hybrid approach is faster, it becomes possible to apply low overhead circuit-based heuristics that would be unavailable in the CNF domain for greater speedup.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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M. Schulz, E. Trischler, and T. Sarfert, "SOCRATES: A highly efficient ATPG System," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 7, pp. 126--137, 1988.
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H. Fujiwara and T. Shimono, "On the Acceleration of Test Generation Algorithms," IEEE Transactions on Computers, vol. C-32, pp. 265--272, 1983.
 
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P. Goel, "An implicit enumeration algorithm to generate tests for Combinational circuits," IEEE Transactions on Computers, vol. C-30, pp. 215--222, 1981.
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M. N. Velev, "Benchmark Suites. http://www.ece.cmu.edu/~mvelev," October 2000.

CITED BY  29

Collaborative Colleagues:
Malay K. Ganai: colleagues
Pranav Ashar: colleagues
Aarti Gupta: colleagues
Lintao Zhang: colleagues
Sharad Malik: colleagues