Using embedded FPGAs for SoC yield improvement

ABSTRACT

In this paper we show that an embedded FPGA core is an ideal host to implement infrastructure IP for yield improvement in a bus-based SoC. We present methods for testing, diagnosing, and repairing embedded FPGAs, for which complete testability is achieved without any area overhead or performance degradation. We show how an FPGA core can provide embedded testers for other cores in the SoC, so that cores designed to be tested with external vectors can be tested with BIST, and the entire SoC can be tested with a low-cost tester.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability
      B.8.1 Reliability, Testing, and Fault-Tolerance

General Terms:
Algorithms, Design, Reliability