Reduction of SOC test data volume, scan power and testing time using alternating run-length codes

ABSTRACT

We present a test resource partitioning (TRP) technique that simultaneously reduces test data volume, test application time and scan power. The proposed approach is based on the use of alternating run-length codes for test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced test data volume, test application time and low power scan testing can indeed be achieved in all cases.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.3 Reliability and Testing**

General Terms:
Algorithms, Design, Experimentation, Reliability, Verification