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A general probabilistic framework for worst case timing analysis
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 39th annual Design Automation Conference table of contents
New Orleans, Louisiana, USA
SESSION: Advances in timing and simulation table of contents
Pages: 556 - 561  
Year of Publication: 2002
ISBN ~ ISSN:0738-100X , 1-58113-461-4
Authors
Michael Orshansky  University of California, Berkeley
Kurt Keutzer  University of California, Berkeley
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 9,   Downloads (12 Months): 48,   Citation Count: 64
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ABSTRACT

The traditional approach to worst-case static-timing analysis is becoming unacceptably conservative due to an ever-increasing number of circuit and process effects. We propose a fundamentally different framework that aims to significantly improve the accuracy of timing predictions through fully probabilistic analysis of gate and path delays. We describe a bottom-up approach for the construction of joint probability density function of path delays, and present novel analytical and algorithmic methods for finding the full distribution of the maximum of a random path delay space with arbitrary path correlations.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Boning, D., and Nassif, S., "Models of Process Variations in Device and Interconnect", in Design of High-Performance Microprocessor Circuits, A. Chandrakasan (ed.), 2000
 
2
M. Orshansky, "Increasing Circuit Performance through Statistical Design Techniques," in Closing the Gap Between ASIC and Custom, Kluwer, D. Chinnery, K. Keutzer (ed.), 2002
3
 
4
Semiconductor Industry Association, International Technology Roadmap for Semiconductors, 2001
 
5
S. Nassif, "Statistical worst-case analysis for integrated circuits," Statistical Approaches to VLSI, Elsevier Science, 1994
 
6
 
7
H.-F. Jyu, S. Malik, S. Devadas, K. Keutzer, "Statistical timing analysis of combinational logic circuits," IEEE Trans. on VLSI Systems, vol.1, (no.2), June 1993. p.126--37
 
8
M. Berkelaar, "Statistical Delay Calculation", International Workshop on Logic Synthesis, 1997
 
9
S. Zanella et al, "Statistical Timing Macromodeling of Digital IP Libraries", Workshop on Statistical Metrology, 2000
 
10
R. Adler, An Introduction to Continuity, Extrema, and Related Topics for General Gaussian Processes, 1990, p. 49
 
11
M. Orshansky, DAC 2002 Technical Materials, www-device.eecs.berkeley.edu/~omisha/dac2002.htm
 
12
D. Pollard, A User's Guide to Measure Theoretic Probability, Cambridge University Press, 2001

CITED BY  64

Collaborative Colleagues:
Michael Orshansky: colleagues
Kurt Keutzer: colleagues