| On output response compression in the presence of unknown output values |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 39th annual Design Automation Conference
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New Orleans, Louisiana, USA
SESSION: Novel DFT, BIST and diagnosis techniques
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Pages: 255 - 258
Year of Publication: 2002
ISBN ~ ISSN:0738-100X , 1-58113-461-4
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Downloads (6 Weeks): 3, Downloads (12 Months): 10, Citation Count: 11
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ABSTRACT
A circuit may produce unknown output values during simulation of an input sequence due to an unknown initial state or due to the existence of tri-state elements. For circuits tested using BIST, unknown output values make it impossible to determine a single unique signature for the fault free circuit. To accommodate unknown output values in a BIST scheme, we describe a procedure for synthesizing a minimal logic block that replaces unknown output values by a known constant. The proposed procedure ensures that the BIST scheme will be able to detect all the faults detectable by the input sequence applied to the circuit while allowing a single unique signature to be obtained.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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G. Eide, "Embedded Deterministic Test - DFT Technology for Low-Cost IC Manufacturing Test", www.mentor.com/dft.
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Ruifeng Guo , Sudhakar M. Reddy , Irith Pomeranz, Proptest: a property based test pattern generator for sequential circuits using test compaction, Proceedings of the 36th ACM/IEEE conference on Design automation, p.653-659, June 21-25, 1999, New Orleans, Louisiana, United States
[doi> 10.1145/309847.310019]
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CITED BY 11
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Yuyi Tang , Hans-Joachim Wunderlich , Piet Engelke , Ilia Polian , Bernd Becker , Jürgen Schlöffel , Friedrich Hapke , Michael Wittke, X-masking during logic BIST and its impact on defect coverage, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.14 n.2, p.193-202, February 2006
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Harald Vranken , Sandeep Kumar Goel , Andreas Glowatz , Juergen Schloeffel , Friedrich Hapke, Fault detection and diagnosis with parity trees for space compaction of test responses, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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