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A simulation-based cost modeling methodology for evaluation of interbay material handling in a semiconductor wafer fab
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Source Winter Simulation Conference archive
Proceedings of the 32nd conference on Winter simulation table of contents
Orlando, Florida
SESSION: Semiconductor manufacturing table of contents
Pages: 1510 - 1517  
Year of Publication: 2000
ISBN:0-7803-6582-8
Authors
Shari Murray  Arizona State University, Tempe, AZ
Gerald T. Mackulak  Arizona State University, Tempe, AZ
John W. Fowler  Arizona State University, Tempe, AZ
Theron Colvin  Arizona State University, Tempe, AZ
Sponsors
IIE : Institute of Industrial Engineers
ASA : American Statistical Association
IEEE/CS : Institute of Electrical and Electronics Engineers/Computer Society
IEEE/SMCS : Institute of Electrical and Electronics Engineers/Systems, Man, and Cybernetics Society
INFORMS-CS : Institute for Operations Research and the Management Sciences-College on Simulation
NIST : National Institute of Standards and Technology
SIGSIM: ACM Special Interest Group on Simulation and Modeling
SCS : The Society for Computer Simulation International
Publisher
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 27,   Citation Count: 2
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ABSTRACT

In the next generation of semiconductor wafer fabrication facilities, decisions concerning material handling systems will be a major factor in initial facility cost, operational cost, production cycle times, and possibly product yield percentages. The wafers will increase in diameter to 300 mm and a new front opening unified pod (FOUP) has been designed to carry them, both increasing the weight of a production lot. This increase requires substantial automation for ergonomic and quality reasons. As a result, semiconductor manufacturers are asking, "What level of automation is financially justifiable?"Automation suppliers have stated that automation saves money, but have as yet not produced a sufficiently detailed financial analysis proving their premise. In this paper, both a fully automated and a manual material handling system are simulated and compared in a thorough cost analysis. Sensitivity analysis is performed on inflation rate, interest rate, die price, wafer start rate, and yield percentage to validate the results of the analyses.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Cardarelli, G. and P. M. Pelagagge, 1995. Simulation tool for designed and management optimization of automated interbay material handling and storage systems for large wafer fab. IEEE Transactions on Semiconductor Manufacturing 8 (1): 44-49.
 
2
Colvin, Theron and Gerald Mackulak, 1999. Fab design and development methodology much change to allow for successful integration of all systems. Semiconductor Fabtech 10: 155-166.
 
3
Fowler, J. W., Brown, S. W., Gold, H., Schoemig, A., "Measurable Improvements in Cycle-Time Constrained Capacity", Proceedings of the Sixth International Symposium on Semiconductor Manufacturing, San Francisco, CA, pp. A21-A24, 1997.
 
4
Weiss, Mitchell, 1999. New twists on fab design and layout. Semiconductor International (July): 103-108.
 
5
Wright, Williams and Kelley, 1995. User Manual, Factory Explorer Version 2.7. Pleasanton, CA: Wright Williams and Kelly.
 
6
Yang, Taho and Brett A. Peters, 1997. A spine layo9ut design method for semiconductor fabrication facilities containing automated material-handling systems. International Journal of Operations & Production Management 17 (5): 490-501.

Collaborative Colleagues:
Shari Murray: colleagues
Gerald T. Mackulak: colleagues
John W. Fowler: colleagues
Theron Colvin: colleagues