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Plenoptic stitching: a scalable method for reconstructing 3D interactive walk throughs
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Source International Conference on Computer Graphics and Interactive Techniques archive
Proceedings of the 28th annual conference on Computer graphics and interactive techniques table of contents
Pages: 443 - 450  
Year of Publication: 2001
ISBN:1-58113-374-X
Authors
Daniel G. Aliaga  Lucent Technologies, Bell Laboratories
Ingrid Carlbom  Lucent Technologies, Bell Laboratories
Sponsor
SIGGRAPH: ACM Special Interest Group on Computer Graphics and Interactive Techniques
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 9,   Downloads (12 Months): 53,   Citation Count: 15
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ABSTRACT

Interactive walkthrough applications require detailed 3D models to give users a sense of immersion in an environment. Traditionally these models are built using computer-aided design tools to define geometry and material properties. But creating detailed models is time-consuming and it is also difficult to reproduce all geometric and photometric subtleties of real-world scenes. Computer vision attempts to alleviate this problem by extracting geometry and photogrammetry from images of the real-world scenes. However, these models are still limited in the amount of detail they recover.

Image-based rendering generates novel views by resampling a set of images of the environment without relying upon an explicit geometric model. Current such techniques limit the size and shape of the environment, and they do not lend themselves to walkthrough applications. In this paper, we define a parameterization of the 4D plenoptic function that is particularly suitable for interactive walkthroughs and define a method for its sampling and reconstructing. Our main contributions are: 1) a parameterization of the 4D plenoptic function that supports walkthrough applications in large, arbitrarily shaped environments; 2) a simple and fast capture process for complex environments; and 3) an automatic algorithm for reconstruction of the plenoptic function.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  15

Collaborative Colleagues:
Daniel G. Aliaga: colleagues
Ingrid Carlbom: colleagues