| Scaling of stack effect and its application for leakage reduction |
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International Symposium on Low Power Electronics and Design
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Proceedings of the 2001 international symposium on Low power electronics and design
table of contents
Huntington Beach, California, United States
Pages: 195 - 200
Year of Publication: 2001
ISBN:1-58113-371-5
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Authors
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Siva Narendra
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Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA and Microprocessor Research Laboratories, Intel Corporation, Hillsboro, OR
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Vivek De
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Microprocessor Research Laboratories, Intel Corporation, Hillsboro, OR
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Dimitri Antoniadis
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Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA
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Anantha Chandrakasan
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Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA
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Shekhar Borkar
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Microprocessor Research Laboratories, Intel Corporation, Hillsboro, OR
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| Bibliometrics |
Downloads (6 Weeks): 26, Downloads (12 Months): 108, Citation Count: 29
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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Y. Ye, S. Borkar, and V. De, "A Technique for Standby Leakage Reduction in High-Performance Circuits," Symp. of VLSI Circuits, pp. 40-41, 1998.
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J. P. Halter and F. Najm, "A gate-level leakage power reduction method for ultra-low-power CMOS circuits," Custom Integrated Circuits Conf., pp. 475-478, 1997.
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Zhanping Chen , Mark Johnson , Liqiong Wei , Kaushik Roy, Estimation of standby leakage power in CMOS circuits considering accurate modeling of transistor stacks, Proceedings of the 1998 international symposium on Low power electronics and design, p.239-244, August 10-12, 1998, Monterey, California, United States
[doi> 10.1145/280756.280917]
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L. Su, R. Schulz, J. Adkisson, K. Beyer, G. Biery, W. Cote, E. Crabbe, D. Edelstein, J. Ellis-Monaghan, E. Eld, D. Foster, R. Gehres, R. Goldblatt, N. Greco, C. Guenther, J. Heidenreich, J. Herman, D. Kiesling, L. Lin, S-H. Lo, McKenn, "A high-performance sub-0.25mm CMOS technology with multiple thresholds and copper interconnects," Intl. Symp. on VLSI Technology, Systems, and Applications, pp. 18-19, 1998.
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D. T. Blaauw , A. Dharchoudhury , R. Panda , S. Sirichotiyakul , C. Oh , T. Edwards, Emerging power management tools for processor design, Proceedings of the 1998 international symposium on Low power electronics and design, p.143-148, August 10-12, 1998, Monterey, California, United States
[doi> 10.1145/280756.280866]
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Z. Liu, C. Hu, J. Huang, T. Chan, M. Jeng, P. Ko, and Y. Cheng, "Threshold Voltage Model for Deep-Submicrometer MOSFET's," IEEE Trans. Elec. Devices, vol. 40, no. 1, pp. 86-95, January 1993.
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Y. Taur, "CMOS Scaling beyond 0.1mm: how far can it go?" Intl. Symp. on VLSI Technology, Systems, and Applications, pp. 6-9, 1999.
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S. Tyagi, M. Alavi, R. Bigwood, T. Bramblett, J. Bradenburg, W. Chen, B. Crew, M. Hussein, P. Jacob, C. Kenyon, C. Lo, B. Mcintyre, Z. Ma, P. Moon, P. Nguyen, L. Rumaner, R. Schweinfurth, S. Sivakumar, M. Stettler, S. Thompson, B. Tufts, J. Xu, S. Yang, and M. Bohr, "A 130 nm Generation Logic Technology Featuring 70 nm Transistors, Dual Vt Transistors and 6 layers of Cu Interconnects," Intl. Elec. Devices Meeting, pp. 567-570, December 2000.
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CITED BY 29
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W. Hung , Y. Xie , N. Vijaykrishnan , M. Kandemir , M. J. Irwin , Y. Tsai, Total power optimization through simultaneously multiple-vDD multiple-vTH assignment and device sizing with stack forcing, Proceedings of the 2004 international symposium on Low power electronics and design, August 09-11, 2004, Newport Beach, California, USA
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Y.-F. Tsai , D. Duarte , N. Vijaykrishnan , M. J. Irwin, Implications of technology scaling on leakage reduction techniques, Proceedings of the 40th conference on Design automation, June 02-06, 2003, Anaheim, CA, USA
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Rajeev R. Rao , David Blaauw , Dennis Sylvester , Charles J. Alpert , Sani Nassif, An efficient surface-based low-power buffer insertion algorithm, Proceedings of the 2005 international symposium on Physical design, April 03-06, 2005, San Francisco, California, USA
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Saibal Mukhopadhyay , Keunwoo Kim , Ching-Te Chuang , Kaushik Roy, Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits, Proceedings of the 2005 international symposium on Low power electronics and design, August 08-10, 2005, San Diego, CA, USA
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Koushik K. Das , Rajiv V. Joshi , Ching-Te Chuang , Peter W. Cook , Richard B. Brown, New optimal design strategies and analysis of ultra-low leakage circuits for nano-scale SOI technology, Proceedings of the 2003 international symposium on Low power electronics and design, August 25-27, 2003, Seoul, Korea
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Keunwoo Kim , Koushik K. Das , Rajiv V. Joshi , Ching-Te Chuang, Nanoscale CMOS circuit leakage power reduction by double-gate device, Proceedings of the 2004 international symposium on Low power electronics and design, August 09-11, 2004, Newport Beach, California, USA
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