Ordered mutation testing

Subscribe (Full Service)


	Search: The ACM Digital Library The Guide

	Feedback

Ordered mutation testing

Full text

Pdf (188 KB)

Source

ACM SIGSOFT Software Engineering Notes archive
Volume 15 , Issue 2 (April 1990) table of contents

Pages: 29 - 30

Year of Publication: 1990

ISSN:0163-5948

Authors

I. M. M. Duncan	Computer Science, School of Engineering and Applied Sciences, University of Durham, Science Laboratories, South Road, Durham, England DH1 3LE
D. J. Robson	Computer Science, School of Engineering and Applied Sciences, University of Durham, Science Laboratories, South Road, Durham, England DH1 3LE

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 1, Downloads (12 Months): 23, Citation Count: 1

Additional Information:

abstract references cited by index terms collaborative colleagues

Tools and Actions:	Review this Article Save this Article to a Binder Display Formats: BibTeX EndNote ACM Ref

DOI Bookmark:	Use this link to bookmark this Article: http://doi.acm.org/10.1145/382296.382699 What is a DOI?

ABSTRACT

Mutation Analysis is an established technique for test data generation and source code testing. Developed systems have concentrated on applying some or all of the possible mutant operators (perturbations) to the submitted code. Recent work tackled the scheduling of mutant program execution on vector processors or a Hypercube as a cost reduction scheme. This paper discusses a logical mechanism of impact driven testing in order to acheive full mutation testing with reduced overheads regardless of implementation. Guiding the mutant generation by block impact together with mutant operator heirarchies and a test data coverage scheme enable an efficient tool to be constructed.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	[1] A. T. Acree, T. A. Budd, R. A. DeMillo, R. J. Lipton, and F. G. Sayward. Mutation Analysis . Technical Report GIT-ICS-79/08, School of Information and Computer Science, Georgia Institute of Technology, Atlanta GA, September 1979.
	2	Allen Troy Acree, Jr., On mutation, Georgia Institute of Technology, Atlanta, GA, 1980
	3	Timothy Alan Budd, Mutation analysis of program test data, Yale University, New Haven, CT, 1980
	4	[4] T. A. Budd, R. A. DeMillo, R. J. Lipton, and F. G. Sayward. The design of a prototype mutation system for program testing. In Proceedings NCC, AFIPS Conference Record, pages 623- 627, 1978.
	5	[5] T. Budd and F. Sayward. Users Guide to the Pilot Mutation System. Technical Report 114. Department of Computer Science, Yale University, 1977.
	6	[6] R. A. DeMillo, D. S. Guindi, K. N. King, W. M. McCracken, and A. J. Offutt. An extended overview of the Mothra software testing environment. In Proceedings of the Second Workshop on Software Testing, Verification and Analysis, IEEE Computer Society Press, Banff Alberta. July 1988.
	7	[7] W. F. Appelbe, R. A. DeMillo, D. S. Guindi, K. N. King, and W. M. McCracken. Using Mutation Analysis for testing ADA programs. Technical Report SERC-TR-9-P, Purdue University, West Lafayette, Indiana 47907, 1989.
	8	[8] H. Agarwal, R. DeMillo, R. Hathaway, Wm. Hsu, W Hsu, E. Krauser, R. J. Martin, A. Mathur, and E. Spafford. Design of Mutant Operators for the C Programming Language. Technical Report SERC-TR-41-P, Purdue University, West Lafayette, Indiana, March 1989.
	9	[9] R. A. DeMillo, R. J. Lipton, and F. G. Sayward. Hints on test data selection: help for the practicing programmer. Computer, 11(4), April 1978.
	10	[10] J. Hartmann and D. J. Robson. Revalidation during the software maintenance phase. In Proceedings of the Conference on Software Maintenance, IEEE Computer Society Press, October 1989.