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Statistics for parallelism and abstraction level in digital simulation
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 24th ACM/IEEE Design Automation Conference table of contents
Miami Beach, Florida, United States
Pages: 588 - 591  
Year of Publication: 1987
ISBN:0-8186-0781-5
Authors
L. Soule  Stanford University, Center for Integrated Systems
R. Blank  Stanford University, Center for Integrated Systems
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 5,   Citation Count: 12
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ABSTRACT

This paper presents statistics of several designs at four design abstraction levels - the instruction, behavioral, RTL, and gate levels. The data includes simulation time profiles, maximum speedup and limitations of parallelism, typical model evaluation times, event distributions, element intensities, and component counts for the four abstraction levels. This data is then used to analyze and evaluate several speed-up approaches: mixed-level simulation, parallel software simulators, parallel pipelined hardware accelerators, and decreased time resolution. The results show that element activity is around 0.1 to 0.5% at any particular time point. For the example circuits (3400 gates, 5000 gates, and 150,000 transistors), simulations show that parallelism can obtain speed-ups between 10-30. We found a factor of roughly ten speed-up between each of the abstraction levels.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Paul Chow, Personal communicaUon.
 
2
Tom Blank, "A Survey of Hardware Accelerators Used in Computer-Aided Design", IEEE Transactions on Design and Test, August, 1984, pp. 21-39.
 
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Lightner, Moceyunas, "CSIM: The Evorution of a Behavioral Level Simulator from a Functional Simulator: Implementation Issues and Performance Measurements", ICCAD.85, IEEE, November 1985, pp. 350-352.
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CITED BY  12