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ABSTRACT
This work addresses the problem of automating the electrical optimization of combinatorial MOS circuits. Improvements to a circuit's speed, area and power consumption are sought through modifications to the transistor sizes in the circuit; no changes in the circuit structure, number of gates or clocking are introduced. Linear algorithms are presented for computing optimal transistor sizes to minimize delay, area or power. These algorithms are implemented in an interactive tool, Aesop. Aesop is a powerful and fast “what-if” tool that allows the designer to explore the space of designs having optimal transistor sizes. When compared to manual designs, the circuits produced by Aesop are typically faster or have substantially lower area and power consumption. Compared to untuned circuits, Aesop typically increases circuit speed by a factor of 2 to 4. Alternatively, power consumption and transistor area can be reduced by 25 — 50% with no sacrifice in circuit speed. These improvements are computed interactively on a professional workstation for circuits containing thousands of transistors.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 15
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Shen Lin , M. Marek-Sadowska , Ernest S. Kuh, Delay and area optimization in standard-cell design, Proceedings of the 27th ACM/IEEE conference on Design automation, p.349-352, June 24-27, 1990, Orlando, Florida, United States
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Yung-Ching Hsieh , Chi-Yi Hwang , Youn-Long Lin , Yu-Chin Hsu, LiB: a cell layout generator, Proceedings of the 27th ACM/IEEE conference on Design automation, p.474-479, June 24-27, 1990, Orlando, Florida, United States
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S. Kim , R. M. Owens , M. J. Irwin, Experiments with a performance driven module generator, Proceedings of the 29th ACM/IEEE conference on Design automation, p.687-690, June 08-12, 1992, Anaheim, California, United States
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Olivier Coudert , Ramsey Haddad , Srilatha Manne, New algorithms for gate sizing: a comparative study, Proceedings of the 33rd annual conference on Design automation, p.734-739, June 03-07, 1996, Las Vegas, Nevada, United States
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