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Modeling and minimization of interconnect energy dissipation in nanometer technologies
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 38th annual Design Automation Conference table of contents
Las Vegas, Nevada, United States
Pages: 754 - 757  
Year of Publication: 2001
ISBN:1-58113-297-2
Authors
Clark N. Taylor  Department of Electrical and Computer Engineering, University of California, San Diego
Sujit Dey  Department of Electrical and Computer Engineering, University of California, San Diego
Yi Zhao  Department of Electrical and Computer Engineering, University of California, San Diego
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 2,   Downloads (12 Months): 19,   Citation Count: 10
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ABSTRACT

As the technology sizes of semiconductor devices continue to decrease, the effect of nanometer technologies on interconnects, such as crosstalk glitches and timing variations, become more significant. In this paper, we study the effect of nanometer technologies on energy dissipation in interconnects. We propose a new power estimation technique which considers DSM effects, resulting in significantly more accurate energy dissipation estimates than transition-count based methods for on-chip interconnects. We also introduce an energy minimization technique which attempts to minimize large voltage swings across the cross-coupling capacitances between interconnects. Even though the number of transitions may increase, our method yields a decrease in power consumption of up to 50%.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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P. P. Sotiriadis and A. Chandrakasan, "Low Power Bus Coding Techniques Considering Inter-wire Capacitances", in CICC, May 2000.
 
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UMC Group, 0.18um 1P6M Logic Process Interconnect Capacitance Model (Rev. 1.2), July 1999.
 
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G. K. Wallace, "The JPEG still picture compression standard", in IEEE Trans. on Consumer Electronics, vol. 38, February 1992.
 
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CITED BY  10

Collaborative Colleagues:
Clark N. Taylor: colleagues
Sujit Dey: colleagues
Yi Zhao: colleagues