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Reducing the frequency gap between ASIC and custom designs: a custom perspective
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 38th annual Design Automation Conference table of contents
Las Vegas, Nevada, United States
Pages: 432 - 437  
Year of Publication: 2001
ISBN:1-58113-297-2
Authors
Stephen E. Rich  RA2-401 2501 NW 229th, Ave., Hillsboro, OR
Matthew J. Parker  RA2-401 2501 NW 229th, Ave., Hillsboro, OR
Jim Schwartz  RA2-401 2501 NW 229th, Ave., Hillsboro, OR
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 7,   Downloads (12 Months): 23,   Citation Count: 3
Additional Information:

abstract   cited by   index terms   collaborative colleagues  

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ABSTRACT

This paper proposes that the ability to control the difference between the simulated and actual frequencies of a design is a key strategy to achieving high frequency in both ASIC and custom designs. We will examine this principle and the methodologies that can be deployed to manage this gap.


CITED BY  3
Xiaoliang Bai , Chandu Visweswariah , Philip N. Strenski, Uncertainty-aware circuit optimization, Proceedings of the 39th conference on Design automation, June 10-14, 2002, New Orleans, Louisiana, USA
Osama Neiroukh , Xiaoyu Song, Improving the Process-Variation Tolerance of Digital Circuits Using Gate Sizing and Statistical Techniques, Proceedings of the conference on Design, Automation and Test in Europe, p.294-299, March 07-11, 2005
Andreas Wortmann , Sven Simon , Matthias Müller, A High-Speed Transceiver Architecture Implementable as Synthesizable IP Core, Proceedings of the conference on Design, automation and test in Europe, p.30046, February 16-20, 2004

INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS

Additional Classification:
  B. Hardware
  B.8 Performance and Reliability

  I. Computing Methodologies
  I.2 ARTIFICIAL INTELLIGENCE
      I.2.3 Deduction and Theorem Proving
          Subjects: Uncertainty, "fuzzy," and probabilistic reasoning

  J. Computer Applications
  J.2 PHYSICAL SCIENCES AND ENGINEERING
      Subjects: Electronics


General Terms:
Design, Measurement, Performance, Theory

Collaborative Colleagues:
Stephen E. Rich: colleagues
Matthew J. Parker: colleagues
Jim Schwartz: colleagues

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