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A new structural pattern matching algorithm for technology mapping
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 38th annual Design Automation Conference table of contents
Las Vegas, Nevada, United States
Pages: 371 - 376  
Year of Publication: 2001
ISBN:1-58113-297-2
Authors
Min Zhao  Advanced Tools, Motorola Inc., Austin, TX, Dept. of ECE, University of Minnesota, Minneapolis, MN
Sachin S. Sapatnekar  Advanced Tools, Motorola Inc., Austin, TX, Dept. of ECE, University of Minnesota, Minneapolis, MN
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

In this paper, a new structural matching algorithm for technology mapping is proposed. The algorithm is based on a key observation that the matches for a node in a subject Boolean network are related to the matches for its children. The structural relationships between the library cells are modeled using a lookup table. The proposed method is fast, has low memory usage, and is easy to implement. Experimental results show speedups of 20x over Matsunaga's fast mapping approach, and orders of magnitude over SIS, with the same or slightly better results, and much lower memory utilization.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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E. Detjens, G. Gannot, R. Rudell, A. Sangiovanni-Vincentelli, and A. Wang, "Technology mapping in MIS," in Proc. ICCAD, pp. 116-119, 1987.
 
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Collaborative Colleagues:
Min Zhao: colleagues
Sachin S. Sapatnekar: colleagues