A new gate delay model for simultaneous switching and its applications

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A new gate delay model for simultaneous switching and its applications

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 38th annual Design Automation Conference table of contents

Las Vegas, Nevada, United States

Pages: 289 - 294

Year of Publication: 2001

ISBN:1-58113-297-2

Authors

Liang-Chi Chen
Sandeep K. Gupta
Melvin A. Breuer

Sponsors

EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 4, Downloads (12 Months): 30, Citation Count: 14

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ABSTRACT

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY 14

	Seung Hoon Choi , Kaushik Roy , Florentin Dartu, Timed pattern generation for noise-on-delay calculation, Proceedings of the 39th conference on Design automation, June 10-14, 2002, New Orleans, Louisiana, USA
	M.M Vaseekar Kumar , S. Padmanaban , S. Tragoudas, Low power ATPG for path delay faults, Proceedings of the 14th ACM Great Lakes symposium on VLSI, April 26-28, 2004, Boston, MA, USA
	M. M. Vaseekar Kumar , S. Tragoudas, Low power test generation for path delay faults using stability functions, Proceedings of the 15th ACM Great Lakes symposium on VLSI, April 17-19, 2005, Chicago, Illinois, USA
	Chirayu Amin , Chandramouli Kashyap , Noel Menezes , Kip Killpack , Eli Chiprout, A multi-port current source model for multiple-input switching effects in CMOS library cells, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
	Wei-Yu Chen , Sandeep K. Gupta , Melvin A. Breuer, Test Generation for Crosstalk-Induced Faults: Framework and Computational Results, Journal of Electronic Testing: Theory and Applications, v.18 n.1, p.17-28, February 2002
	Liang-Chi Chen , Sandeep K. Gupta , Melvin A. Breuer, TA-PSV—Timing Analysis for Partially Specified Vectors, Journal of Electronic Testing: Theory and Applications, v.18 n.1, p.73-88, February 2002
	Chandramouli Kashyap , Chirayu Amin , Noel Menezes , Eli Chiprout, A nonlinear cell macromodel for digital applications, Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, November 05-08, 2007, San Jose, California
	Kenneth S. Stevens , Florentin Dartu, Algorithms for MIS vector generation and pruning, Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design, November 05-09, 2006, San Jose, California
	Sujit T. Zachariah , Yi-Shing Chang , Sandip Kundu , Chandra Tirumurti, On Modeling Cross-Talk Faults, Proceedings of the conference on Design, Automation and Test in Europe, p.10490, March 03-07, 2003
	Takayuki Fukuoka , Akira Tsuchiya , Hidetoshi Onodera, Statistical gate delay model for multiple input switching, Proceedings of the 2008 conference on Asia and South Pacific design automation, January 21-24, 2008, Seoul, Korea
	Arijit Mondal , Partha. P. Chakrabarti , C. R. Mandal, A New Approach to Timing Analysis Using Event Propagation and Temporal Logic, Proceedings of the conference on Design, automation and test in Europe, p.21198, February 16-20, 2004
	Rajeshwary Tayade , Sani Nassif , Jacob Abraham, Analytical model for the impact of multiple input switching noise on timing, Proceedings of the 2008 conference on Asia and South Pacific design automation, January 21-24, 2008, Seoul, Korea
	Noel Menezes , Chandramouli Kashyap , Chirayu Amin, A "true" electrical cell model for timing, noise, and power grid verification, Proceedings of the 45th annual conference on Design automation, June 08-13, 2008, Anaheim, California
	Behnam Amelifard , Safar Hatami , Hanif Fatemi , Massoud Pedram, A current source model for CMOS logic cells considering multiple input switching and stack effect, Proceedings of the conference on Design, automation and test in Europe, March 10-14, 2008, Munich, Germany