A sigma-delta modulation based BIST scheme for mixed-signal circuits

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A sigma-delta modulation based BIST scheme for mixed-signal circuits

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Asia and South Pacific Design Automation Conference archive
Proceedings of the 2000 Asia and South Pacific Design Automation Conference table of contents

Yokohama, Japan

Pages: 605 - 612

Year of Publication: 2000

ISBN:0-7803-5974-7

Authors

Jiun-Lang Huang	Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA
Kwang-Ting Cheng	Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA

Sponsors

IEEE-CAS : Circuits & Systems
IPSJ : Information Processing Society of Japan
SIGDA: ACM Special Interest Group on Design Automation
IEICE : Inst of Electronics, Info & Communication Engineers

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 0, Downloads (12 Months): 11, Citation Count: 5

Additional Information:

references cited by collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	M. Soma. A design-for-testability methodology for active analog filter. In International Test Conference, pages 183-192, 1990.
	2	M. Soma and V. Kolarik. A design-for-test technique for switched-capacitor filters. In IEEE VLSI Test Symposium, pages 42-47, 1994.
	3	M. F. Toner and G. W. Roberts. A BIST scheme for a SNR, gain tracking, and frequency response test of a sigma-delta ADC. IEEE Transactions on Circuits and Systems-II, 42(1):1-15, January 1995.
	4	Chen-Yang Pan , Kwang-Ting Cheng, Implicit functional testing for analog circuits, Proceedings of the 14th IEEE VLSI Test Symposium (VTS '96), p.489, April 28-May 01, 1996
	5	Karim Arabi , Bozena Kaminska, Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits, Proceedings of the IEEE International Test Conference, p.786-795, November 03-05, 1997
	6	Ara Hajjar , Gordon W. Roberts, A high speed and area efficient on-chip analog waveform extractor, Proceedings of the 1998 IEEE International Test Conference, p.688-697, October 18-22, 1998
	7	X. Haurie and G. W. Roberts. Arbitrary-precision signal generation for mixed-signal built-in-self-test. IEEE Transactions on Circuits and Systems-II, 45(11):1425-1432, November 1998.
	8	K. Arabi and B. Kaminska. On chip testing data converters using static parameters. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 6(3):409-419, September 1998.
	9	Evan M. Hawrysh , Gordon W. Roberts, An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures, Proceedings of the IEEE International Test Conference on Test and Design Validity, p.528-537, October 20-25, 1996
	10	Benoit Dufort , Gordon W. Roberts, Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams, Proceedings of the IEEE International Test Conference, p.396-405, November 03-05, 1997
	11	Benoit Dufort , Gordon W. Roberts, Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques, Proceedings of the 1998 IEEE International Test Conference, p.241-248, October 18-22, 1998
	12	R. M. Gray. Oversampled sigma-delta modulation. IEEE Transactions on Communications, 35(5):481-489, May 1987.
	13	Matthew Mahoney, DSP-Based Testing of Analog and Mixed-Signal Circuits, IEEE Computer Society Press, Los Alamitos, CA, 1987

CITED BY 5

	A. Krstic , W. C. Lai , K. T. Cheng , L. Chen , S. Dey, Embedded software-based self-testing for SoC design, Proceedings of the 39th conference on Design automation, June 10-14, 2002, New Orleans, Louisiana, USA
	Angela Krstic , Wei-Cheng Lai , Kwang-Ting Cheng , Li Chen , Sujit Dey, Embedded Software-Based Self-Test for Programmable Core-Based Designs, IEEE Design & Test, v.19 n.4, p.18-27, July 2002
	Marcia G. Méndez-Rivera , Alberto Valdes-Garcia , Jose Silva-Martinez , Edgar Sánchez-Sinencio, An On-Chip Spectrum Analyzer for Analog Built-In Testing, Journal of Electronic Testing: Theory and Applications, v.21 n.3, p.205-219, June 2005
	Hao-Chiao Hong, A design-for-digital-testability circuit structure for Σ-Δ modulators, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.15 n.12, p.1341-1350, December 2007
	Xuan-Lun Huang , Chen-Yuan Yang , Jiun-Lang Huang, Diagnosing integrator leakage of single-bit first-order ΔΣ modulator using DC input, Proceedings of the 2009 Conference on Asia and South Pacific Design Automation, January 19-22, 2009, Yokohama, Japan

Collaborative Colleagues:

Jiun-Lang Huang: colleagues

Kwang-Ting Cheng: colleagues

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