Analog-testability analysis by determinant-decision-diagrams based symbolic analysis

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Analog-testability analysis by determinant-decision-diagrams based symbolic analysis

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Asia and South Pacific Design Automation Conference archive
Proceedings of the 2000 Asia and South Pacific Design Automation Conference table of contents

Yokohama, Japan

Pages: 541 - 546

Year of Publication: 2000

ISBN:0-7803-5974-7

Authors

Tao Pi	Department of Electrical Engineering, University of Washington, Seattle, WA
C.-J. Richard Shi	Department of Electrical Engineering, University of Washington, Seattle, WA

Sponsors

IEEE-CAS : Circuits & Systems
IPSJ : Information Processing Society of Japan
SIGDA: ACM Special Interest Group on Design Automation
IEICE : Inst of Electronics, Info & Communication Engineers

Publisher

ACM New York, NY, USA

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references collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	N. Sen and R. Saeks, "Fault diagnosis for linear systems via multifrequency measurement," IEEE Trans. Circuits and Systems, vol. CAS-26, pp. 457- 465, July 1979.
	2	H. M. S. Chen and R. Saeks, "A search algorithm for the solution of multifrequency fault diagnosis equations", IEEE Trans. Circuits and Systems, vol. CAS-26, pp. 589-594, July 1979.
	3	C.-J. Richard Shi , Xiangdong Tan, Symbolic analysis of large analog circuits with determinant decision diagrams, Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design, p.366-373, November 09-13, 1997, San Jose, California, United States
	4	C.-J. Shi and X.-D. Tan, "Efficient derivation of exact s-expanded symbolic expressions for behavioral modeling of analog circuits", pp. 463- 466 in Proc. IEEE Custom Integrated Circuits Conference, San Diego, CA, May 12-14,1998.
	5	R. Carmassi, M. Catelani, G. Iuculano, A. Liberatore, S. Manetti and M. Marini, "Analog network testability measurement: A symbolic formulation approach", IEEE Trans. Instrumentation and Measurement, vol. 40, no. 6, pp 930-935, December, 1991.
	6	G. Fedi, R. Giomi, A. Luchetta, S. Manetti and M.C. Piccirilli, "On the application of symbolic techniques to the multiple fault location in low testability analog circuits", IEEE Trans. Circuits and Systems, vol. 45, no. 10, pp. 1383-1388, October, 1998.
	7	A. Liberatore and S. Manetti, "Network sensitivity analysis via symbolic formulation", Proc. 1989 IEEE Int. Symp. Circuits Syst., Portland, OR, pp. 705-708, May, 1989.
	8	S. Manetti and A. Liberatore, Chapter 13, "Symbolic analysis techniques-applications to analog design automation", IEEE Press, 1998.
	9	G. Fedi, and et.al., "A new symbolic method for analog circuit testability evaluation", IEEE Trans. Instrumentation and Measurement, vol.47, no.2, pp. 554-565, April, 1998.
	10	Georges G. Gielen , Willy M. Sansen, Symbolic Analysis for Automated Design of Analog Integrated Circuits, Kluwer Academic Publishers, Norwell, MA, 1991

Collaborative Colleagues:

Tao Pi: colleagues

C.-J. Richard Shi: colleagues

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