Optimization of error detecting codes for the detection of crosstalk originated errors

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Optimization of error detecting codes for the detection of crosstalk originated errors

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Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents

Munich, Germany

Pages: 290 - 296

Year of Publication: 2001

ISBN:0-7695-0993-2

Authors

M. Favalli	DI, University of Ferrara, Viale Saragat, 1 - 44100 Ferrara, Italy
C. Metra	DEIS, University of Bologna, Viale Risorgimento, 2 - 40136 Bologna, Italy

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
ECSI :
IEEE-CS\DATC : IEEE Computer Society
RAS : RAS
EDAC : Electronic Design Automation Consortium
IEEE-CS\TTTC : Test Technology Technical Council
IFIP WG 10.5 : IFIP WG 10.5
EDAA : European Design Automation Association

Publisher

IEEE Press Piscataway, NJ, USA

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Downloads (6 Weeks): 0, Downloads (12 Months): 5, Citation Count: 4

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY 4

	Maurizio Martina , Guido Masera, A statistical model for estimating the effect of process variations on crosstalk noise, Proceedings of the 2004 international workshop on System level interconnect prediction, February 14-15, 2004, Paris, France
	Davide Bertozzi , Luca Benini , Giovanni De Micheli, Energy-reliability trade-off for NoCs, Networks on chip, Kluwer Academic Publishers, Hingham, MA, 2003
	I.-C. Lin , S. Srinivasan , N. Vijaykrishnan , N. Dhanwada, Transaction Level Error Susceptibility Model for Bus Based SoC Architectures, Proceedings of the 7th International Symposium on Quality Electronic Design, p.775-780, March 27-29, 2006
	Shoaib Akram , Scott Cromar , Gregory Lucas , Alexandros Papakonstantinou , Deming Chen, VEBoC: variation and error-aware design for billions of devices on a chip, Proceedings of the 2008 conference on Asia and South Pacific design automation, January 21-24, 2008, Seoul, Korea