| Use of the LRU stack depth distribution for simulation of paging behavior |
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Communications of the ACM
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Volume 20 , Issue 11 (November 1977)
table of contents
Pages: 795 - 798
Year of Publication: 1977
ISSN:0001-0782
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Downloads (6 Weeks): 4, Downloads (12 Months): 45, Citation Count: 6
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ABSTRACT
Two families of probability distributions were needed for use by a virtual memory simulation model: headway between page fault distributions, and working set size distributions. All members of both families can be derived from the LRU stack depth distribution. Simple expressions for the computation of both kinds of distributions are given. Finally, examples are given of both families of distributions as computed from a published stack depth distribution.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Mattson, R.L., Gecsei, J., Slutz, D.R., and Traiger, I.L. Evaluation techniques for storage hierarchies. IBM Syst. J. 9, 2 (1970), 78-117.
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Spirn, F.R., and Denning, P.J. Experiments with program locality. Proc. AFIPS 1972 FJCC, AFIPS Press, Montvale, N.J., pp. 611-621.
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Sager, G.R. Reproducing program memory reference behavior. Proc. Comptr. Sci. and Statist.: Seventh Annual Symp. on the Interface, Oct. 1973, pp. 41-47.
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Turner, R. Simulation of paging behavior. Tech. Memo. 005- 171-003, Digital Equipment Corp., Maynard Mass., Oct. 1975.
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