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Toward a psychophysically-based light reflection model for image synthesis
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Proceedings of the 27th annual conference on Computer graphics and interactive techniques table of contents
Pages: 55 - 64  
Year of Publication: 2000
ISBN:1-58113-208-5
Authors
Fabio Pellacini  Program of Computer Graphics, Cornell University, 580 Rhodes Hall, Ithaca, NY
James A. Ferwerda  Program of Computer Graphics, Cornell University, 580 Rhodes Hall, Ithaca, NY
Donald P. Greenberg  Program of Computer Graphics, Cornell University, 580 Rhodes Hall, Ithaca, NY
Sponsor
SIGGRAPH: ACM Special Interest Group on Computer Graphics and Interactive Techniques
Publisher
ACM Press/Addison-Wesley Publishing Co.  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 6,   Downloads (12 Months): 58,   Citation Count: 23
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ABSTRACT

In this paper we introduce a new light reflection model for image synthesis based on experimental studies of surface gloss perception. To develop the model, we've conducted two experiments that explore the relationships between the physical parameters used to describe the reflectance properties of glossy surfaces and the perceptual dimensions of glossy appearance. In the first experiment we use multidimensional scaling techniques to reveal the dimensionality of gloss perception for simulated painted surfaces. In the second experiment we use magnitude estimation methods to place metrics on these dimensions that relate changes in apparent gloss to variations in surface reflectance properties. We use the results of these experiments to rewrite the parameters of a physically-based light reflection model in perceptual terms. The result is a new psychophysically-based light reflection model where the dimensions of the model are perceptually meaningful, and variations along the dimensions are perceptually uniform. We demonstrate that the model can facilitate describing surface gloss in graphics rendering applications. This work represents a new methodology for developing light reflection models for image synthesis.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  23

Collaborative Colleagues:
Fabio Pellacini: colleagues
James A. Ferwerda: colleagues
Donald P. Greenberg: colleagues