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Clocktree RLC extraction with efficient inductance modeling
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Paris, France
Pages: 522 - 526  
Year of Publication: 2000
ISBN:1-58113-244-1
Authors
Norman Chang  Hewlett-Packard Laboratories, Palo Alto, CA
Shen Lin  Hewlett-Packard Laboratories, Palo Alto, CA
Lei He  ECE Dept., University of Wisconsin, Madison, WI
O. Sam Nakagawa  Hewlett-Packard Laboratories, Palo Alto, CA
Weize Xie  Hewlett-Packard Laboratories, Palo Alto, CA
Sponsors
EDAA : European Design Automation Association
SIGDA: ACM Special Interest Group on Design Automation
ECSI :
RAS : RAS
EDAC : Electronic Design Automation Consortium
IEEE-CS : Computer Society
IFIP : International Federation for Information Processing
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 6,   Citation Count: 4
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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N. Chang, V. Kanevsky, O. S. Nakagawa, K. Rahmat, and S.-Y. Oh, "Fast Generation of Statistically-based Worst- Case Modeling of On-Chip Interconnect", IEEE ICCD 1997.
 
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L. He, N. Chang, S. Lin, and O. S. Nakakawa, "Efficient Inductance Modeling for On-chip Interconnects", IEEE CICC, 1999.
 
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Raphael User Manual, Avant! Corporation
 
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A.E. Ruehli, "Inductance Calculation in a Complex Integrated Circuit Environment," IBM Journal of Res. & Dev., 1972.
 
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A.E. Ruehli, "Equivalent Circuit Models for Three- Dimensional Multiconductor Systems," IEEE Trans. on MIT, 1974.
 
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M. Kamon, M.J. Tsuk, J. White, "Fasthenry: a Multipole- Accelerated 3D Inductance Extraction Program," IEEE Trans. on MIT, 1994.
 
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Collaborative Colleagues:
Norman Chang: colleagues
Shen Lin: colleagues
Lei He: colleagues
O. Sam Nakagawa: colleagues
Weize Xie: colleagues