| The generalized boundary curve — a common method for automatic nominal design centering of analog circuits |
| Full text |
Publisher Site
,
Pdf
(110 KB)
|
| Source
|
Design, Automation, and Test in Europe
archive
Proceedings of the conference on Design, automation and test in Europe
table of contents
Paris, France
Pages: 42 - 47
Year of Publication: 2000
ISBN:1-58113-244-1
|
|
Authors
|
|
R. Schwencker
|
Institute of Electronic Design Automation, Technical University of Munich, 81609 Munich, Germany and Infineon Technologies, P.O. Box 80 09 49, 81617 Munich, Germany
|
|
F. Schenkel
|
Institute of Electronic Design Automation, Technical University of Munich, 81609 Munich, Germany
|
|
H. Graeb
|
Institute of Electronic Design Automation, Technical University of Munich, 81609 Munich, Germany
|
|
K. Antreich
|
Institute of Electronic Design Automation, Technical University of Munich, 81609 Munich, Germany
|
|
| Sponsors |
|
| Publisher |
|
| Bibliometrics |
Downloads (6 Weeks): 2, Downloads (12 Months): 13, Citation Count: 3
|
|
|
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
H. Abdel-Malek and A. Hassan. The ellipsoidal technique for design centering and region approximation. IEEE Trans. on CAD, 10:1006-1013, 1991.
|
| |
2
|
K. Antreich, H. Graeb, and C. Wieser. Circuit analysis and optimization driven by worst-case distances. IEEE Trans. on CAD, 13(1):57-71, 1994.
|
| |
3
|
J. Bandler and S. Chen. Circuit optimization: The state of the art. IEEE Trans. on Microwaves Theory Techniques (MTT), 36:424-442, 1988.
|
| |
4
|
A. R. Conn, E K. Coulman, R. A. Haring, G. L. Morill, C. Visweswariah, and C. W. Wu. JiffyTune: Circuit optimization using time-domain sensitivities. IEEE Trans. on CAD, 17(12):1292-1309, Dec. 1998.
|
 |
5
|
Maria del Mar Hershenson , Stephen P. Boyd , Thomas H. Lee, GPCAD: a tool for CMOS op-amp synthesis, Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design, p.296-303, November 08-12, 1998, San Jose, California, United States
[doi> 10.1145/288548.288628]
|
| |
6
|
|
| |
7
|
J. Ecküller , M. Gröpl , H. Gräb, Hierarchical characterization of analog integrated CMOS circuits, Proceedings of the conference on Design, automation and test in Europe, p.636-643, February 23-26, 1998, Le Palais des Congrés de Paris, France
|
| |
8
|
K. Eshbaugh. Generation of correlated parameters for statistical circuit simulation. IEEE Trans. on CAD, 11:1198- 1206, 1992.
|
| |
9
|
U. Feldmann, U. Wever, Q. Zheng, R. Schultz, and H. Wriedt. Algorithms for modern circuit simulation. Archiv fiir Elektronik und lTbertragungstechnik (AEIT), 46:274- 285, 1992.
|
| |
10
|
M. Krasnicki, R. Phelps, R. A. Rutenbar, and L. R. Carley. MAELSTROM: Efficient simulation-based synthesis for custom analog cells. 1999.
|
| |
11
|
K. Krishna and S. Director. The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability. IEEE Trans. on CAD, 14(12):1557-1568, Dec. 1995.
|
| |
12
|
Francky Leyn , Walter Daems , Georges Gielen , Willy Sansen, A behavioral signal path modeling methodology for qualitative insight in and efficient sizing of CMOS opamps, Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design, p.374-381, November 09-13, 1997, San Jose, California, United States
|
| |
13
|
M. D. Meehan and J. Purviance. Yield and Reliablility in Microwave Circuit and System Design. Artech House Boston/London, 1993.
|
| |
14
|
E.S. Ochotta, R. A. Rutenbar, and L. R. Carley. Synthesis of high-performance analog circuits in ASTRX/OBLX. IEEE Trans. on CAD, 15(3):273-294, March 1996.
|
| |
15
|
R. Schwencker. Automatic design centering of analog integrated circuits based on the generalized boundary curve of multiple robustness objectives. Technical Report TUM- LEA-99-1, Technical University Munich, 1999.
|
 |
16
|
R. Schwencker , J. Eckmueller , H. Graeb , K. Antreich, Automating the sizing of analog CMOS circuits by consideration of structural constraints, Proceedings of the conference on Design, automation and test in Europe, p.69-es, January 1999, Munich, Germany
[doi> 10.1145/307418.307516]
|
| |
17
|
J. C. Zhang and M. A. Styblinski. Yield and Variability Optimization of Integrated Circuits. Kluwer Academic Publishers, 1995.
|
| |
18
|
S. Zizala, J. Eckmueller, and H. Graeb. Fast calculation of analog circuits' feasibility regions by low level functional measures. In IEEE Int. Conf. on Electronics, Circuits and Systems, pages 85-88, Sept. 1998.
|
CITED BY 3
|
|
|
|
|
M. Bühler , J. Koehl , J. Bickford , J. Hibbeler , U. Schlichtmann , R. Sommer , M. Pronath , A. Ripp, DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
|
|
|
|
|