A novel algorithm to extract two-node bridges

ABSTRACT

Defect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is considerably faster and that it has higher capacity.

REFERENCES

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability

Additional Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS

  C. Computer Systems Organization

  J. Computer Applications

General Terms:
Algorithms, Design, Experimentation, Measurement, Performance, Theory