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A switch level fault simulation environment
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 37th Annual Design Automation Conference table of contents
Los Angeles, California, United States
Pages: 780 - 785  
Year of Publication: 2000
ISBN:1-58113-187-9
Authors
V. Krishnaswamy  Intel Corporation, RA2-401, 2501 NW 229th Ave, Hillsboro, OR
J. Casas  Intel Corporation, JFT-104, 2111 NE 25th Ave, Hillsboro, OR
T. Tetzlaff  Intel Corporation, JFT-103, 2111 NE 25th Ave, Hillsboro, OR
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 2,   Downloads (12 Months): 9,   Citation Count: 2
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ABSTRACT

This paper presents a fault simulation environment which accepts pure switch level or mixed switch/RT level descriptions of the design under test. Switch level fault injection strategies for the stuck-at, transition and logic bridge models are presented. A fault simulation algorithm is presented, along with design issues and optimizations. The fault simulation algorithm places no restrictions on the circuit styles used to implement designs. Mixed level simulation issues are discussed. Fault simulation performance numbers on large industrial benchmarks are reported.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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K.-T. Cheng. Transition Fault Testing for Sequential Circuits. IEEE Trans. Comput., 12(12):1971-1983, December 1993.
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F. J. Ferguson. Inductive Fault Analysis of VLSI Circuits. PhD thesis, Carnegie Mellon University, Department of Electrical and Computer Engineering, October 1987.
 
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T. M. Niermann, W.-T. Cheng, and J. H. Patel. PROOFS: A Fast Memory-Efficient Sequential Circuit Fault Simulator. IEEE Transactions on Computer-Aided Design, II(2):1908-207, February 1992.
 
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Collaborative Colleagues:
V. Krishnaswamy: colleagues
J. Casas: colleagues
T. Tetzlaff: colleagues