| A switch level fault simulation environment |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 37th Annual Design Automation Conference
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Los Angeles, California, United States
Pages: 780 - 785
Year of Publication: 2000
ISBN:1-58113-187-9
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Authors
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V. Krishnaswamy
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Intel Corporation, RA2-401, 2501 NW 229th Ave, Hillsboro, OR
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J. Casas
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Intel Corporation, JFT-104, 2111 NE 25th Ave, Hillsboro, OR
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T. Tetzlaff
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Intel Corporation, JFT-103, 2111 NE 25th Ave, Hillsboro, OR
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Downloads (6 Weeks): 2, Downloads (12 Months): 9, Citation Count: 2
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ABSTRACT
This paper presents a fault simulation environment which accepts pure switch level or mixed switch/RT level descriptions of the design under test. Switch level fault injection strategies for the stuck-at, transition and logic bridge models are presented. A fault simulation algorithm is presented, along with design issues and optimizations. The fault simulation algorithm places no restrictions on the circuit styles used to implement designs. Mixed level simulation issues are discussed. Fault simulation performance numbers on large industrial benchmarks are reported.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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R. E. Bryant , D. Beatty , K. Brace , K. Cho , T. Sheffler, COSMOS: a compiled simulator for MOS circuits, Proceedings of the 24th ACM/IEEE conference on Design automation, p.9-16, June 28-July 01, 1987, Miami Beach, Florida, United States
[doi> 10.1145/37888.37890]
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Jeremy Casas , Hannah Yang , Manpreet Khaira , Mandar Joshi , Thomas Tetzlaff , Steve Otto , Erik Seligman, Logic Verification of Very Large Circuits Using Shark, Proceedings of the 12th International Conference on VLSI Design - 'VLSI for the Information Appliance', p.310, January 10-13, 1999
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K.-T. Cheng. Transition Fault Testing for Sequential Circuits. IEEE Trans. Comput., 12(12):1971-1983, December 1993.
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F. J. Ferguson. Inductive Fault Analysis of VLSI Circuits. PhD thesis, Carnegie Mellon University, Department of Electrical and Computer Engineering, October 1987.
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Sankaran Karthik , Mark Aitken , Glidden Martin , Srinivasu Pappula , Bob Stettler , Praveen Vishakantaiah , Manuel A. d'Abreu , Jacob A. Abraham, Distributed Mixed Level Logic and Fault Simulation on the Pentium® Pro Microprocessor, Proceedings of the IEEE International Test Conference on Test and Design Validity, p.160-166, October 20-25, 1996
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T. M. Niermann, W.-T. Cheng, and J. H. Patel. PROOFS: A Fast Memory-Efficient Sequential Circuit Fault Simulator. IEEE Transactions on Computer-Aided Design, II(2):1908-207, February 1992.
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E. Vandris , G. Sobelman, Algorithms for fast, memory efficient switch-level fault simulation, Proceedings of the 28th conference on ACM/IEEE design automation, p.138-143, June 17-22, 1991, San Francisco, California, United States
[doi> 10.1145/127601.127645]
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