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Fast temperature calculation for transient electrothermal simulation by mixed frequency/time domain thermal model reduction
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 37th Annual Design Automation Conference table of contents
Los Angeles, California, United States
Pages: 750 - 755  
Year of Publication: 2000
ISBN:1-58113-187-9
Authors
Ching-Han Tsai  Coordinated Science Laboratory, Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1308 W. Main St., Urbana, IL
Sung-Mo Kang  Coordinated Science Laboratory, Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1308 W. Main St., Urbana, IL
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 7,   Downloads (12 Months): 20,   Citation Count: 3
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ABSTRACT

In full-c hip elecrothermal analysis, the substrate is usually discretized into a lumped 3-D network to simulate the heat flow, which is computationally inefficient due to the numerous internal nodes represen ting the substrate interior. Y et traditional interconnect model reduction techniques are not v ery effectiv e at handling complex mlti-port networks with large port counts. In this work we overcome this limitation b y applying time-domain approximation techniques such as ARWE and Prony's method to further simplify the reduced substrate thermal netw ork. Experiments show that our method provides highly accurate simulation results with performance improvement in the range of 2x to 5x.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Y.-K. Cheng, P. Raha, C.-C. Teng, E. Rosenbaum and S. M. Kang, "ILLIADS-T: An Electrothermal Timing Simulator for Temperature-Sensitive Reliability Diagnosis of CMOS VLSI Chips," IEEE Trans. on CAD, Vol. 17, No. 8, August 1998, pp. 668-681.
 
2
P. Leturcq, J. Dorkel, A. Napieralski, "A New Approach to Thermal Analysis of Power Devices," IEEE Trans. on Electron Devices, vol. 34, no. 5, pp. 1147-1156, 1987.
 
3
K. Fukahori and P. R. Gray, "Computer Simulation of Integrated Circuits in the Presence of Electrothermal Interactions," IEEE J. Solid-State Circuits, vol. SC-11, December 1976, pp. 834-846.
 
4
 
5
J. P. Fradin, B. Desaunettes, "Automatic Computation of Conductive Conductances Intervening in the Thermal Chain," 25th International Conference on Environmental Systems, July 1995.
 
6
A. J. Chapman, Heat Transfer, 4th ed. New York, NY: Macmillan Publishing Company, 1984.
 
7
M. N. Ozisik, Boundary Value Problems of Heat Condition. New York, NY:Dover, 1968.
 
8
 
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K. J. Kerns and A. T. Yang, "Stable and Efficient Reduction of Large, Multiport RC Network by Pole Analysis via Congruence Transformations," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, Vol. 16, No.7, July 1997, pp. 734-744.
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12
 
13
 
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B. N. Parlett and D. S. Scott, "The Lanczos Algorithm with Selective Orthogonalizatoin," Mathematical Computation, vol. 33, pp. 217-238, Jan. 1979.
 
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Collaborative Colleagues:
Ching-Han Tsai: colleagues
Sung-Mo Kang: colleagues