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Boolean satisfiability in electronic design automation
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 37th Annual Design Automation Conference table of contents
Los Angeles, California, United States
Pages: 675 - 680  
Year of Publication: 2000
ISBN:1-58113-187-9
Authors
João P. Marques-Silva  Departments of Informatics, Technical University of Lisbon, IST/INESC, Cadence European Labs, Lisbon, Portugal
Karem A. Sakallah  Department of EECS, University of Michigan, Ann Arbor, Michigan
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 17,   Downloads (12 Months): 84,   Citation Count: 10
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ABSTRACT

Boolean Satisfiability (SAT) is often used as the underlying model for a significant and increasing number of applications in Electronic Design Automation (EDA) as well as in many other fields of Computer Science and Engineering. In recent years, new and efficient algorithms for SAT have been developed, allowing much larger problem instances to be solved. SAT “packages” are currently expected to have an impact on EDA applications similar to that of BDD packages since their introduction more than a decade ago. This tutorial paper is aimed at introducing the EDA professional to the Boolean satisfiability problem. Specifically, we highlight the use of SAT models to formulate a number of EDA problems in such diverse areas as test pattern generation, circuit delay computation, logic optimization, combinational equivalence checking, bounded model checking and functional test vector generation, among others. In addition, we provide an overview of the algorithmic techniques commonly used for solving SAT, including those that have seen widespread use in specific EDA applications. We categorize these algorithmic techniques, indicating which have been shown to be best suited for which tasks.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. Abramovici, M. A. Breuer and A. D. Friedman, Digital Systems Testing and Testable Design, Computer Science Press, 1990.
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E Barth, "A Davis-Putnam Based Enumeration Algorithm for Linear pseudo-Boolean Optimization," Technical Report MPI-I-95-2-003, Max-Planck-Institut fur Informatik, 1995.
 
4
R. Bayardo Jr. and R. Schrag, "Using CSP Look-Back Techniques to Solve Real-World SAT Instances," in Proceedings of the National Conference on Artificial Intelligence (AAAI-97), 1997.
 
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7
 
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J. Kim, J. Marques-Silva, H. Savoj and K. A. Sakallah, "RID-GRASP: Redundancy Identification and Removal Using GRASP", in International Workshop on Logic Synthesis, May 1997.
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19
 
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T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability," IEEE Transactions on Computer-Aided Design, vol. 11, no. 1, pp. 4-15, January 1992.
 
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C.-M. Li, "Equivalency Reasoning to Solve a Class of Hard SAT Problems," Submitted for publication. (Available from http://www.research.att.com/^-kautz/challenge/cli.ps.)
 
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V. Manquinho, A. Oliveira and J. Marques-Silva, "Models and Algorithms for Computing Minimum-Size Prime Implicants," in Proceedings of the International Workshop on Boolean Problems, September 1998.
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E McGeer, A. Saldanha, E R. Stephan, R. K. Brayton and A. L. Sangiovanni-Vincentelli, "Timing Analysis and Delay-Test Generation Using Path Recursive Functions," in Proceedings of the International Conference on Computer- Aided Design, November 1991.
 
29
30
 
31
A. Saldanha and V. Singhal, "Solving Satisfiability in CAD Problems," in Proceedings of the Cadence Technical Conference, May 1997.
 
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B. Selman, H. Levesque and D. Mitchell, "A New Method for Solving Hard Satisfiability Problems," in Proceedings of the National Conference on Artificial Intelligence (AAAI- 92), pp. 440-446, 1992.
 
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L. G. Silva, J. E Marques-Silva, L. M. Silveira and K. A. Sakallah, "Satisfiability Models and Algorithms for Circuit Delay Computation," in Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, December 1997.
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E R. Stephan, R. K. Brayton and A. L. Sangiovanni-Vincentelli, "Combinational Test Generation Using Satisfiability," IEEE Transactions on Computer-Aided Design, vol. 15, no. 9, pp. 1167-1176, September 1996.
 
39
 
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R. Zabih and D. A. McAllester, "A Rearrangement Search Strategy for Determining Propositional Satisfiability," in Proceedings of the National Conference on Artificial Intelligence, pp. 155-160, 1988.
 
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CITED BY  10

Collaborative Colleagues:
João P. Marques-Silva: colleagues
Karem A. Sakallah: colleagues