| High-level simulation of substrate noise generation including power supply noise coupling |
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Annual ACM IEEE Design Automation Conference
archive
Proceedings of the 37th Annual Design Automation Conference
table of contents
Los Angeles, California, United States
Pages: 446 - 451
Year of Publication: 2000
ISBN:1-58113-187-9
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Authors
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Marc van Heijningen
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IMEC v.z.w., Kapeldreef 75, B-3001 Leuven, Belgium
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Mustafa Badaroglu
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IMEC v.z.w., Kapeldreef 75, B-3001 Leuven, Belgium
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Stéphane Donnay
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IMEC v.z.w., Kapeldreef 75, B-3001 Leuven, Belgium
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Marc Engels
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IMEC v.z.w., Kapeldreef 75, B-3001 Leuven, Belgium
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Ivo Bolsens
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IMEC v.z.w., Kapeldreef 75, B-3001 Leuven, Belgium
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Downloads (6 Weeks): 15, Downloads (12 Months): 45, Citation Count: 12
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ABSTRACT
Substrate noise caused by large digital circuits will degrade the performance of analog circuits located on the same substrate. To simulate this performance degradation, the total amount of generated substrate noise must be known. Simulating substrate noise generated by large digital circuits is however not feasible with existing circuit simulators and detailed substrate models due to the long simulation times and high memory requirements. We have developed a methodology to simulate this substrate noise generation at a higher level. Not only does this methodology take noise coupling from switching gates into account, but also noise coupling from the power supply is included. This paper describes this simulation methodology. In the paper it is shown that the high-level simulations correspond very well with SPICE simulations and that a large gain in simulation speed is obtained. This high-level simulation methodology makes it possible to predict substrate noise generation of large digital circuits in a very efficient way, early in the design flow of mixed-signal ASICs.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 12
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M. Badaroglu , M. van Heijningen , V. Gravot , S. Donnay , H. De Man , G. Gielen , M. Engels , I. Bolsens, High-level simulation of substrate noise generation from large digital circuits with multiple supplies, Proceedings of the conference on Design, automation and test in Europe, p.326-330, March 2001, Munich, Germany
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G. Van der Plas , M. Badaroglu , G. Vandersteen , P. Dobrovolny , P. Wambacq , S. Donnay , G. Gielen , H. De Man, High-level simulation of substrate noise in high-ohmic substrates with interconnect and supply effects, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA
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Mustafa Badaroglu , Kris Tiri , StÉphane Donnay , Piet Wambacq , Hugo De Man , Ingrid Verbauwhede , Georges Gielen, Clock tree optimization in synchronous CMOS digital circuits for substrate noise reduction using folding of supply current transients, Proceedings of the 39th conference on Design automation, June 10-14, 2002, New Orleans, Louisiana, USA
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Rajeev Murgai , Subodh M. Reddy , Takashi Miyoshi , Takeshi Horie , Mehdi Baradaran Tahoori, Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis, Proceedings of the conference on Design, automation and test in Europe, p.10610, February 16-20, 2004
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