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Critical path analysis using a dynamically bounded delay model
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 37th Annual Design Automation Conference table of contents
Los Angeles, California, United States
Pages: 260 - 265  
Year of Publication: 2000
ISBN:1-58113-187-9
Author
Soha Hassoun  Tufts University, Medford, MA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 4,   Downloads (12 Months): 21,   Citation Count: 10
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ABSTRACT

This paper focuses on static timing analysis in the presence of capacitive coupling. We propose a novel gate delay model, the dynamically bounded delay model. In contrast to the min-max or bounded delay model which assumes a fixed delay range, [dmin, dmax], for each circuit component, our new model allows for the specification of delay variations and the conditions upon which the variations will hold. Novel static timing analysis algorithms can thus dynamically bound the delays. To demonstrate the effectiveness of this model and approach, we use our model to perform critical path analysis in the presence of capacitive coupling. Our experiments show that our approach avoids pessimism when compared to PERT analysis assuming worst case capacitive coupling.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  10