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Symbolic timing simulation using cluster scheduling
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 37th Annual Design Automation Conference table of contents
Los Angeles, California, United States
Pages: 254 - 259  
Year of Publication: 2000
ISBN:1-58113-187-9
Authors
Clayton B. McDonald  Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA
Randal E. Bryant  Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 10,   Downloads (12 Months): 20,   Citation Count: 3
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ABSTRACT

We recently introduced symbolic timing simulation (STS) using data-dependent delays as a tool for verifying the timing of full-custom transistor-level circuit designs, and for the functional verification of delay-dependent logic. While STS leverages efficient symbolic encodings to yield huge gains over conventional simulation methodologies, it still suffers from a problem known as event multiplication. We discuss this problem and present an event-list management technique based on event-clusters, and a new simulator which utilizes this technique. Finally, we demonstrate substantial speedups on a wide range of test cases, including exponential improvement on a simple logic chain.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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R. E. Bryant. Symbolic Verification of MOS Circuits. 1985 Chapel Hill Conference on VLSI, pages 418-438, 1985.
 
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R. E. Bryant. Boolean Analysis of MOS Circuits. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, CAD-6(4):634-639, July 1987.
 
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C. Y. Chu. Improved Models for Switch-Level Simulation. PhD thesis, Stanford University, October 1988.
 
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I. Hajj and D. Saab. Symbolic Logic Simulation of MOS Circuits. International Conference on Circuits and Systems, pages 249-249, 1983.
 
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F. Somenzi. CUDD: CU Decision Diagram Package - Release 2.2.0, Online User Manual, May 1998.


Collaborative Colleagues:
Clayton B. McDonald: colleagues
Randal E. Bryant: colleagues