Improved fault diagnosis in scan-based BIST via superposition

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Improved fault diagnosis in scan-based BIST via superposition

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 37th Annual Design Automation Conference table of contents

Los Angeles, California, United States

Pages: 55 - 58

Year of Publication: 2000

ISBN:1-58113-187-9

Authors

Ismet Bayraktaroglu	Computer Science & Engineering Department, University of California, San Diego, La Jolla, CA
Alex Orailoğlu	Computer Science & Engineering Department, University of California, San Diego, La Jolla, CA

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 4, Downloads (12 Months): 10, Citation Count: 8

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ABSTRACT

An improved approach for diagnosis of scan-based BIST designs is proposed. The enhancement in diagnosis is achieved by utilizing the superposition principle. Scan cells are partitioned pseudorandomly for observation and the ones provably fault free are removed from the potentially faulty list. Diagnostic resolution is improved by a novel application of the superposition principle, resulting in significant reductions in diagnosis time.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	R. C. Aitken and V. K. Agarwal. A diagnosis method using pseudo-random vectors without intermediate signatures. In International Conference on Computer-Aided Design, pages 574-580, 1989.
	2	J. C. Chan and J. A. Abraham. A study of faulty signatures using a matrix formulation. In International Test Conference, pages 553-561, 1990.
	3	W. H. McAnney and J. Savir. There is information in faulty signatures. In International Test Conference, pages 630-636, 1987.
	4	Janusz Rajski , Jerzy Tyszer, Diagnosis of Scan Cells in BIST Environment, IEEE Transactions on Computers, v.48 n.7, p.724-731, July 1999 [doi>10.1109/12.780879]
	5	J. Savir and W. H. McAnney. Identification of failing tests with cycling registers. In International Test Conference, pages 322- 328, 1988.
	6	C. E. Stroud , T. R. Damarla, Improving the efficiency of error identification via signature analysis, Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), p.244, April 30-May 03, 1995

CITED BY 8

	Ismet Bayraktaroglu , Alex Orailoglu, Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST, IEEE Design & Test, v.19 n.1, p.42-53, January 2002
	I. Bayraktaroglu , A. Orailoglu, Diagnosis for scan-based BIST: reaching deep into the signatures, Proceedings of the conference on Design, automation and test in Europe, p.102-111, March 2001, Munich, Germany
	Andrew B. Kahng , Sherief Reda, Combinatorial group testing methods for the BIST diagnosis problem, Proceedings of the 2004 conference on Asia South Pacific design automation: electronic design and solution fair, p.113-116, January 27-30, 2004, Yokohama, Japan
	Ismet Bayraktaroglu , Alex Orailoglu, The Construction of Optimal Deterministic Partitionings in Scan-Based BIST Fault Diagnosis: Mathematical Foundations and Cost-Effective Implementations, IEEE Transactions on Computers, v.54 n.1, p.61-75, January 2005
	Michael Goessel , Krishnendu Chakrabarty , Vitalij Ocheretnij , Andreas Leininger, A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*, Journal of Electronic Testing: Theory and Applications, v.20 n.6, p.611-622, December 2004
	Yoshiyuki Nakamura , Thomas Clouqueur , Kewal K. Saluja , Hideo Fujiwara, Diagnosing at-speed scan BIST circuits using a low speed and low memory tester, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.15 n.7, p.790-800, July 2007
	Chunsheng Liu , Krishnendu Chakrabarty, A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis, Proceedings of the conference on Design, Automation and Test in Europe, p.10230, March 03-07, 2003
	A. Leininger , M. Goessel , P. Muhmenthaler, Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Codes, Proceedings of the conference on Design, automation and test in Europe, p.21302, February 16-20, 2004