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Theoretical limits for signal reflections due to inductance for on-chip interconnections
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Source International Workshop on System-Level Interconnect Prediction archive
Proceedings of the 2000 international workshop on System-level interconnect prediction table of contents
San Diego, California, United States
Pages: 55 - 60  
Year of Publication: 2000
ISBN:1-58113-249-2
Authors
D. Deschacht  Laboratoire d'Informatique, de Robotique et de Microélectronique, U.M.R. C.N.R.S. 5506, 161, rue ADA, 34392 Montpellier Cedex 5, France
G. Servel  Laboratoire d'Informatique, de Robotique et de Microélectronique, U.M.R. C.N.R.S. 5506, 161, rue ADA, 34392 Montpellier Cedex 5, France
F. Huret  Institut d'Electronique et de Microélectronique du Nord, U.M.R. C.N.R.S. 9929, Département Hyperfréquences et Semiconducteurs, Cité Scientifique, Avenue Poincaré, B.P. 69, 59652, Villeneuve d'Ascq, France
E. Paleczny  Institut d'Electronique et de Microélectronique du Nord, U.M.R. C.N.R.S. 9929, Département Hyperfréquences et Semiconducteurs, Cité Scientifique, Avenue Poincaré, B.P. 69, 59652, Villeneuve d'Ascq, France
P. Kennis  Institut d'Electronique et de Microélectronique du Nord, U.M.R. C.N.R.S. 9929, Département Hyperfréquences et Semiconducteurs, Cité Scientifique, Avenue Poincaré, B.P. 69, 59652, Villeneuve d'Ascq, France
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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A. Deutsch et al. ~ When are transmission-line effects important for on-chip interconnections ~, IEEE Transactions on microwave theory and techniques, Vol. 45, No 10, pp.1836-1846, October 1997.
 
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F. Moll, M. Roca, A. Rubio, " Inductance in VLSI interconnection modeling", IEE Proc. Circuits Devices Syst., Vol. 145, n~ 3, pp.175-179, June 1998.
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J.F. Lee, D.K. Sun, Z.J. Cendes, "Full wave analysis of dielectric waveguides using tangential vector finite elements." IEEE Trans. Microwave Theory Tech., Vol. MTT-39, N~8, august 1991.
 
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S. Robillart, B. Kenmei, E. Paleczny, P. Pribetich, P. Kennis, " Study of lossy metallization shape impact on propagation characteristics of planar transmission line used in MMIC application with the vector tangential finite element method ", XXV~me URSI Symposium, Lille,France, august 28 th - september 15 th 1996.
 
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D. Deschacht, E. Vanier, ~ Submicron interconnect modeling for timing evaluation ~, 7 th International Symposium on IC Technology, Systems & Applications, Singapore, 10-12 September 1997.
 
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Collaborative Colleagues:
D. Deschacht: colleagues
G. Servel: colleagues
F. Huret: colleagues
E. Paleczny: colleagues
P. Kennis: colleagues