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Rating of pattern classifications in multi-layer perceptrons: theoretical background and practical results
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Source Symposium on Applied Computing archive
Proceedings of the 1994 ACM symposium on Applied computing table of contents
Phoenix, Arizona, United States
Pages: 142 - 144  
Year of Publication: 1994
ISBN:0-89791-647-6
Authors
W. Ritschel  Aachen University of Technology, Institute of Machine Tools and Production Engineering
T. Pfeifer  Aachen University of Technology, Institute of Machine Tools and Production Engineering
R. Grob  Aachen University of Technology, Institute of Machine Tools and Production Engineering
Sponsors
SIGAPL: ACM Special Interest Group on APL Programming Language
SIGCUE: ACM Special Interest Group on Computer Uses In Education
SIGICE: ACM Special Interest Group on Individual Computing Environment
SIGAPP: ACM Special Interest Group on Applied Computing
SIGBIO: ACM Special Interest Group on Biomedical Computing
Publisher
ACM  New York, NY, USA
Bibliometrics
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
D. Barschdorff, D. Becker, Neurale Netze als Signalund Musterklassifikatoren, Technisches Messen, 11/90
 
2
Gavin J. Gibson, Colin F. Cowan, On the Decision Regions of Multilayer Perceptrons, Proceexlings of the IEEE, Vol. 78, No. 10, October 1990.
 
3
 
4
J. Kindermann, A. Linden, Inversion of neural networks by gradient descent, Parallel Computing 14, 1990.
 
5
T. Pfeifer, C. Scholz, Verbrennungsmotoren im Schleppversuch prufen, Industrie-Anzeiger 76, 1990.
 
6
William S. Meisel, Computer-Oriented Appraoches to Pattern Recognistion, Academic Press, 1972
 
7

Collaborative Colleagues:
W. Ritschel: colleagues
T. Pfeifer: colleagues
R. Grob: colleagues