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CONLOAD—a new lot release rule for semiconductor wafer fabs
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Source Winter Simulation Conference archive
Proceedings of the 31st conference on Winter simulation: Simulation---a bridge to the future - Volume 1 table of contents
Phoenix, Arizona, United States
Pages: 850 - 855  
Year of Publication: 1999
ISBN:0-7803-5780-9
Author
Oliver Rose  Institute of Computer Science, University of Würzburg, 97074 Würzburg, Germany
Sponsors
ACM: Association for Computing Machinery
SIGSIM: ACM Special Interest Group on Simulation and Modeling
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 1,   Downloads (12 Months): 13,   Citation Count: 4
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Atherton, L. F. and R. W. Atherton (1995). Wafer Fabri-cation: Factory Performance and Analysis. Boston: Kluwer.
 
2
Fowler, J. W., G. L. Hogg, and S. J. Mason (1998). Workload control in the semiconductor industry. Technical report, Arizona State University, IMSE, Tempe, AZ.
 
3
Hopp, W. J. and M. L. Spearman (1996). Wafer Fabrication: Factory Performance and Analysis. Chicago: Irwin.
 
4
 
5
Lawton, J. W., A. Drake, R. Henderson, L. M. Wein, R. Whit-ney, and D. Zuanich (1990). Workload regulating wafer release in a GaAs fab facility. In Proceedings of the International Semiconductor Manufacturing Sci-ence Symposium, pp. 33-38.
 
6
 
7
Rose, O. (1999). Estimation of the cycle time distribution of a wafer fab by a simple simulation model. In Proceedings of the SMOMS '99.
 
8
Wein, L. M. (1988). Scheduling semiconductor wafer fab-rication. IEEE Transactions on Semiconductor Manu-facturing 1(3), 115-130.