Test Routines Based on Symbolic Logical Statements

Subscribe (Full Service)


	Search: The ACM Digital Library The Guide

	Feedback

Test Routines Based on Symbolic Logical Statements

Full text

Pdf (221 KB)

Source

Journal of the ACM (JACM) archive
Volume 6 , Issue 1 (January 1959) table of contents

Pages: 33 - 37

Year of Publication: 1959

ISSN:0004-5411

Author

Richard D. Eldred

Datamatic, Newton Highlands, Massachusetts

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 10, Downloads (12 Months): 38, Citation Count: 17

Additional Information:

cited by index terms

Tools and Actions:	Request Permissions Review this Article Save this Article to a Binder Display Formats: BibTeX EndNote ACM Ref

DOI Bookmark:	Use this link to bookmark this Article: http://doi.acm.org/10.1145/320954.320957 What is a DOI?

CITED BY 17

	Kenneth M. Butler , M. Ray Mercer, The influences of fault type and topology on fault model performance and the implications to test and testable design, Proceedings of the 27th ACM/IEEE conference on Design automation, p.673-678, June 24-27, 1990, Orlando, Florida, United States
	Asad Karim , Stephen A. Szygenda, SMARTGEN: the implementation of an expert system for the generation of digital logic diagnostic tests, Proceedings of the 1st international conference on Industrial and engineering applications of artificial intelligence and expert systems, p.355-360, June 1988, Tullahoma, Tennessee, United States
	J. P. Verma , D. M. Selove , J. N. Tessier, Automatic test-generation and test-verification of digital systems, Proceedings of the 11th workshop on Design automation, p.149-158, January 1974
	Robert C. Aiken, Nanometer Technology Effects on Fault Models for IC Testing, Computer, v.32 n.11, p.46-51, November 1999
	R. G. (Ben) Bennitts, Progress in Design for Test: A Personal View, IEEE Design & Test, v.11 n.1, p.53-59, January 1994
	Xiao Liu , Michael S. Hsiao , Sreejit Chakravarty , Paul J. Thadikaran, Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors, Journal of Electronic Testing: Theory and Applications, v.19 n.4, p.437-445, August 2003
	Xiao Liu , Michael S. Hsiao , Sreejit Chakravarty , Paul J. Thadikaran, Efficient techniques for transition testing, ACM Transactions on Design Automation of Electronic Systems (TODAES), v.10 n.2, p.258-278, April 2005
	K. A. Foster, Sensitive test data for logic expressions, ACM SIGSOFT Software Engineering Notes, v.9 n.2, p.120-125, April 1984
	Mark Heap , William A. Rogers, Generating Single-Stuck-Fault Coverage From a Collapsed-Fault Set, Computer, v.22 n.4, p.51-57, April 1989
	William A. Rogers , Jacob A. Abraham, High level hierarchical fault simulation techniques, Proceedings of the 1985 ACM thirteenth annual conference on Computer Science, p.89-97, March 1985, New Orleans, Louisiana, United States
	Rolf Drechsler , Harry Hengster , Horst Schäfer , Joachim Hartmann , Bernd Becker, Testability of 2-Level AND/EXOR Circuits, Journal of Electronic Testing: Theory and Applications, v.14 n.3, p.219-225, June 1999
	Martin Keim , Nicole Drechsler , Rolf Drechsler , Bernd Becker, Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits, Journal of Electronic Testing: Theory and Applications, v.17 n.1, p.37-51, February 2001
	R. Drechsler , H. Hengster , H. Schafer , J. Hartmann , B. Becker, Testability of 2-level AND/EXOR circuits, Proceedings of the 1997 European conference on Design and Test, p.548, March 17-20, 1997
	Bernd Becker , Rolf Drechsler , Rolf Krieger , Sudhakar M. Reddy, A Fast Optimal Robust Path Delay Fault Testable Adder, Proceedings of the 1996 European conference on Design and Test, p.491, March 11-14, 1996
	Xiao Liu , Michael S. Hsiao, A Novel Transition Fault ATPG That Reduces Yield Loss, IEEE Design & Test, v.22 n.6, p.576-584, November 2005
	C. V. Ramamoorthy, A structural theory of machine diagnosis, Proceedings of the April 18-20, 1967, spring joint computer conference, April 18-20, 1967, Atlantic City, New Jersey
	H. Y. Chang , J. M. Scanlon, Design principles for processor maintainability in real-time systems, Proceedings of the November 18-20, 1969, fall joint computer conference, November 18-20, 1969, Las Vegas, Nevada