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A technology independent approach to hierarchical IC layout extraction
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 23rd ACM/IEEE Design Automation Conference table of contents
Las Vegas, Nevada, United States
Pages: 425 - 431  
Year of Publication: 1986
ISBN:0-8186-0702-5
Authors
Ahsan Bootehsaz  Department of Electrical Engineering and Electronics, University of Manchester Institute of Science and Technology, Manchester, England
Robert A. Cottrel  Department of Electrical Engineering and Electronics, University of Manchester Institute of Science and Technology, Manchester, England
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 3,   Citation Count: 3
Additional Information:

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ABSTRACT

This paper describes a set of heuristics for a hierarchical circuit extractor. The strength of these algorithms lies in their capability for fully exploiting the natural hierarchical structure of IC layouts, and in handling overlapping cell instances without creating partial devices. Technology independence is implemented by keeping all technology dependent information in a user accessible file external to the program, which is also used to define the extent of parameter extraction. Circuit extraction is performed in a bottom-up manner and produces a netlist description with the same hierarchical structure as the layout.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Scheffer, L. and Apte, R. "LSI Design Verification Using Topology Extraction." 12th Asilmore Conf. on Circuits, Systems and Computers, pp. 149-153, Nov 1978.
 
2
Munch, P.H. and Munch, K.H., "A General Solution For Design Verification." Proc. Of Internat. Conf. On Circuits And Computers, 1982, PP 320-3
 
3
 
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5
Annevelink, J. , Dewilde, P. and Fokkema, J.T. "A Hierarchical Layout To Circuit Extractor Using A Finite State Approach." Proc. Of internat. Conf. On Circuits And Computers, 1983, pp. 481-484.
 
6
Horwitz, M. and Dutton, R.W. "Resistance Extraction From Mask Layout Data." IEEE Trans. CAD2-NO3 JULY 83 , PP 145-150.
 
7
Newell,M.E.and Fitzpatrick, D.T. "Exploitation Of Hierarchy In Analysis Of Integrated Circuit Artwork" IEEE Trans. CAD-I, No 4, pp. 192-200, Oct 1982.
 
8
Whitney, T., "A Hierarchical Design analysis Front End." Proc. Of VLSI 81, Edinburgh, 1981, pp. 217-227.
 
9
Gupta, A. and Hon, R., "HEXT: A Hierarchical Circuit Extractor." Journal Of VLSI And Computer System, Vol 1, No I, 1983, pp. 23- 39.
 
10
Apte, R. and Chang, N-S. and et al., "Logic Function Extraction For Nmos Circuits." Proc. Of Internat. Conf. On Circuits And Computers, 1982, pp. 324-327.
 
11
Swartz, P.A. and et al. "HCAP: A Topological Analysis Program For IC Mask Artwork." Proc. Of Internat. Conf. On Circuits And Computers, 1983, pp. 298-301.


Collaborative Colleagues:
Ahsan Bootehsaz: colleagues
Robert A. Cottrel: colleagues