PATEGE: an automatic DC parametric test generation system for series gated ECL circuits

ABSTRACT

For ECL circuits. DC parametric tests such as input current (IIL IIH), reference voltage (VBB), and power supply current (ICC) tests are executed as well as functional tests. This paper describes: an automatic DC parametric test generation system PATEGE for the series gated ECL circuits. PATEGE can automatically generate the test patterns and calculate the expected values for IIL, IIH, VBB and ICC tests.

REFERENCES

• 1: T.W. Wi I Jams and l~ P. Parker. ~ Dee~ign for Testzb i I ity - A Servey " IEEK Trans. Comput.. C-31. pp. 2-15, JanL 198Z
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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability

Additional Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS

General Terms:
Design, Measurement, Performance, Theory