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PROTEST: a tool for probabilistic testability analysis
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 22nd ACM/IEEE Design Automation Conference table of contents
Las Vegas, Nevada, United States
Pages: 204 - 211  
Year of Publication: 1985
ISBN:0-8186-0635-5
Author
Hans-Joachim Wunderlich  Universität Karlsruhe, Institut für Informatik IV, (Prof. Dr. Detlef Schmid), D-7500 Karlsruhe, Federal Republic of Germany
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 5,   Citation Count: 19
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ABSTRACT

The CAD-tool PROTEST (Probabilistic Testability Analysis) is presented. PROTEST estimates for each fault of a combinational circuit its detection probability which can be used as a testability measure. Moreover it calculates the number of random test patterns which must be generated in order to achieve the required fault coverage. It is also demonstrated that the fault coverage will increase and the necessary number of random patterns will drastically decrease, if each primary input is stimulated by test patterns having specific probabilities of being logical “1”. PROTEST uses this fact and determines for each input the optimal signal probability for a randomly generated pattern.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  20

Collaborative Colleagues:
Hans-Joachim Wunderlich: colleagues