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A neural network as a quality control monitor of an intelligent system
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Source Symposium on Applied Computing archive
Proceedings of the 1995 ACM symposium on Applied computing table of contents
Nashville, Tennessee, United States
Pages: 263 - 266  
Year of Publication: 1995
ISBN:0-89791-658-1
Authors
Ray R. Hashemi  Department of Computer and Information Science, University of Arkansas at Little Rock
John R. Talburt  Department of Computer and Information Science, University of Arkansas at Little Rock
Meena Velusamy  Department of Computer and Information Science, University of Arkansas at Little Rock
Sponsors
SIGBIO: ACM Special Interest Group on Biomedical Computing
SIGADA: ACM Special Interest Group on Ada Programming Language
SIGCUE: ACM Special Interest Group on Computer Uses In Education
SIGICE: ACM Special Interest Group on Individual Computing Environment
SIGAPP: ACM Special Interest Group on Applied Computing
SIGPLAN: ACM Special Interest Group on Programming Languages
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 1,   Downloads (12 Months): 10,   Citation Count: 2
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Collaborative Colleagues:
Ray R. Hashemi: colleagues
John R. Talburt: colleagues
Meena Velusamy: colleagues