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Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's
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Source International Symposium on Low Power Electronics and Design archive
Proceedings of the 1999 international symposium on Low power electronics and design table of contents
San Diego, California, United States
Pages: 252 - 254  
Year of Publication: 1999
ISBN:1-58113-133-X
Authors
Ali Keshavarzi  MicroComputer Research Labs, Intel Corporation, Hillsboro, OR
Siva Narendra  MicroComputer Research Labs, Intel Corporation, Hillsboro, OR
Shekhar Borkar  MicroComputer Research Labs, Intel Corporation, Hillsboro, OR
Charles Hawkins  The University of New Mexico, Intel Corporation, Hillsboro, OR
Kaushik Roy  Purdue University, Intel Corporation, Hillsboro, OR
Vivek De  MicroComputer Research Labs, Intel Corporation, Hillsboro, OR
Sponsors
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 12,   Downloads (12 Months): 73,   Citation Count: 12
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
T. Kuroda et. al., IEEE JSSC, Nov. 1996, pp. 1770-1779
 
2
T. Kobayashi et. al., 1994 Proc. of CICC, pp. 271-274
 
3
K. Seta et. al., 1995 ISSCC Tech. Dig., pp. 318-319
 
4
S. Thompson et. al., 1997 Symp. VLSI Tech., pp. 69-70
 
5
 
6
J.R. Brews, Chp. 3, High Speed Semiconductor Devices, ed. S.M. Sze, John Wiley & Sons, 1990
 
7
M. Chen et. al., IEEE EDL, April 1998, pp. 134--136

CITED BY  12

Collaborative Colleagues:
Ali Keshavarzi: colleagues
Siva Narendra: colleagues
Shekhar Borkar: colleagues
Charles Hawkins: colleagues
Kaushik Roy: colleagues
Vivek De: colleagues