Digital detection of analog parametric faults in SC filters

Subscribe (Full Service)


	Search: The ACM Digital Library The Guide

	Feedback

Digital detection of analog parametric faults in SC filters

Full text

Pdf (110 KB)

Source

Annual ACM IEEE Design Automation Conference archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference table of contents

New Orleans, Louisiana, United States

Pages: 772 - 777

Year of Publication: 1999

ISBN:1-58133-109-7

Authors

Ramesh Harjani	University of Minnesota, Minneapolis, MN
Bapiraju Vinnakota	University of Minnesota, Minneapolis, MN

Sponsors

EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 3, Downloads (12 Months): 14, Citation Count: 2

Additional Information:

references cited by index terms collaborative colleagues

Tools and Actions:	Request Permissions Review this Article Save this Article to a Binder Display Formats: BibTeX EndNote ACM Ref

DOI Bookmark:	Use this link to bookmark this Article: http://doi.acm.org/10.1145/309847.310056 What is a DOI?

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	B. Vinnakota, Ed., Analog and Mixed-Signal Test, Prentice-Hall, 1998.
	2	K. Arabi , B. Kaminska, Oscillation-test strategy for analog and mixed-signal integrated circuits, Proceedings of the 14th IEEE VLSI Test Symposium (VTS '96), p.476, April 28-May 01, 1996
	3	Chen-Yang Pan , Kwang-Ting Cheng , Sandeep Gupta, A comprehensive fault macromodel for opamps, Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design, p.344-348, November 06-10, 1994, San Jose, California, United States
	4	M. Soma, "A design-for-test methodology for active analog filters," in Proc. IEEE International Test Conference, pp. 183-192, 1990.
	5	Christian Dufaza , Hassan Ihs, Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits, Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), p.252, April 27-May 01, 1997
	6	R. Harjani and B. Vinnakota, "Analog circuit observer blocks," in IEEE Transactions on Circuits and Systems II, pp. 258-263, 1997.
	7	S. Mir , V. Kolarik , M. Lubaszewski , C. Nielsen , B. Courtois, Built-in self-test and fault diagnosis of fully differential analogue circuits, Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design, p.486-490, November 06-10, 1994, San Jose, California, United States
	8	J. L. Huertas , A. Rueda , D. Vázquez, Improving the testability of switched-capacitor filters, Analog Integrated Circuits and Signal Processing, v.4 n.3, p.199-213, Nov. 1993 [doi>10.1007/BF01239074]
	9	B. Vinnakota , R. Harjani , W.-Y. Choi, Pseudoduplication - An ACOB Technique for Single-Ended Circuits, Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications, p.398, January 04-07, 1997
	10	Abhijit Chatterjee, Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums, Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner, p.582-591, October 26-30, 1991
	11	D. Vazquez, A. Rueda, and J. L. Huertas, "A new strategy for testing analog filters," in IEEE VLSI Test Symposium, pp. 36-41, 1994.
	12	J. B. Shyu, G. C. Temes, and F. Krummenarcher, "Random errors in MOS capacitors," IEEE Journal of Solid State Circuits, pp. 1070- 1075, 1982.
	13	M.J.M. Pelgrom, A. C. J. Duinmaijer, and A. E G. Welvers, "Matching properties of MOS transistors," IEEE Journal of Solid-State Circuits, October 1989.
	14	L. Milor and A. Sangiovanni-Vincentelli, "Optimal test set design for analog circuits," in IEEE International Conference on Computer Aided Design, pp. 294-297, November 1990.
	15	C. W. Helstrom, Programability and Stochastic Processes for Engineers, MacMillan Publishing Company, 1991.
	16	Gerard N. Stenbakken , T. Michael Souders, Linear Error Modeling of Analog and Mixed-Signal Devices, Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner, p.573-581, October 26-30, 1991
	17	Roubik Gregorian and Gabor C. Temes, "Analog MOS Integrated Circuits for Signal Processing", Wiley and Sons, 1986
	18	Ramesh Harjani and Tom Lee, "FRC: A Method for Extending the Resolution of Nyquist Rate Converters using Oversampling", IEEE Transactions on Circuits and Systems II, pp 482-494, April 1998
	19	B. Veillette and G. Roberts, Spectrum based built-in self-test., Analog and Mixed-Signal Test, Prentice-Hall, 1998.

CITED BY 2

	Antonio Petraglia , Jorge Morales Cañive , Mariane Rembold Petraglia, A 0.8 μm CMOS switched-capacitor video filter, Proceedings of the 17th symposium on Integrated circuits and system design, September 07-11, 2004, Pernambuco, Brazil
	Jorge M. Cañive , Antonio Petraglia , Mariane R. Petraglia, A 0.8 μm CMOS testable switched-capacitor filter for video frequency applications, Analog Integrated Circuits and Signal Processing, v.48 n.2, p.133-141, August 2006