Dynamic fault diagnosis on reconfigurable hardware

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Dynamic fault diagnosis on reconfigurable hardware

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference table of contents

New Orleans, Louisiana, United States

Pages: 691 - 696

Year of Publication: 1999

ISBN:1-58133-109-7

Authors

Fatih Kocan	Electrical Engineering and Computer Science Department, Case Western Reserve University, Cleveland, Ohio
Daniel G. Saab	Electrical Engineering and Computer Science Department, Case Western Reserve University, Cleveland, Ohio

Sponsors

EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 5, Downloads (12 Months): 13, Citation Count: 4

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	Miron Abramovici , Daniel G. Saab, Satisfiability on reconfigurable hardware, Proceedings of the 7th International Workshop on Field-Programmable Logic and Applications, p.448-456, September 01-03, 1997
	2	M. Abramovici, M. A. Breuer and A. D. Friedman, Digital Systems Testing and Testable Design , IEEE Press, 1994.
	3	Irith Pomeranz , Sudhakar M. Reddy, On Dictionary-Based Fault Location in Digital Logic Circuits, IEEE Transactions on Computers, v.46 n.1, p.48-59, January 1997 [doi>10.1109/12.559802]
	4	Paul G. Ryan , Shishpal Rawatt , W. Kent Fuchs, Two-Stage Fault Location, Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner, p.963-968, October 26-30, 1991
	5	Paul G. Ryan , W. Kent Fuchs , Irith Pomeranz, Fault dictionary compression and equivalence class computation for sequential circuits, Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design, p.508-511, November 07-11, 1993, Santa Clara, California, United States
	6	K. Kubiak , S. Parkes , W. K. Fuchs , R. Saleh, Exact evaluation of diagnostic test resolution, Proceedings of the 29th ACM/IEEE conference on Design automation, p.347-352, June 08-12, 1992, Anaheim, California, United States
	7	Miron Abramovici, A maximal resolution guided-probe testing algorithm, Proceedings of the 18th conference on Design automation, p.189-195, June 29-July 01, 1981, Nashville, Tennessee, United States
	8	Ismed Hartanto , Vamsi Boppana , W. Kent Fuchs, Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis, Proceedings of the IEEE International Test Conference on Test and Design Validity, p.294-302, October 20-25, 1996
	9	J. Richman and K. R. Bowden, "The Modern Fault Dictionary," Proc. 1985 ITC, pp. 696-702.
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	12	Michael Butts , Jon Batcheller , Joseph Varghese, An Efficient Logic Emulation System, Proceedings of the 1991 IEEE International Conference on Computer Design on VLSI in Computer & Processors, p.138-141, October 11-14, 1992
	13	Kwang-Ting Cheng , Shi-Yu Huang , Wei-Jin Dai, Fault emulation: a new approach to fault grading, Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design, p.681-686, November 05-09, 1995, San Jose, California, United States
	14	Irith Pomeranz , Sudhakar M. Reddy, On the generation of small dictionaries for fault location, Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design, p.272-279, November 1992, Santa Clara, California, United States
	15	K. Takayama, F. Hirose, and N. Kawato, "A Test Generation System Using a Logic Simulation Engine," FUJITSU Sci. Tech. J., 27, 3, pp. 285-289, September 1991.
	16	Miron Abramovici , Melvin A. Breuer, Fault diagnosis based on effect-cause analysis: An introduction, Proceedings of the 17th conference on Design automation, p.69-76, June 23-25, 1980, Minneapolis, Minnesota, United States [doi>10.1145/800139.804514]
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CITED BY 4

	Fatih Kocan , Daniel G. Saab, Concurrent D-algorithm on reconfigurable hardware, Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design, p.152-156, November 07-11, 1999, San Jose, California, United States
	Eduardo Augusto Bezerra , Fabian Vargas , Michael Paul Gough, Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques: A Case Study, Journal of Electronic Testing: Theory and Applications, v.17 n.2, p.163-174, April 2001
	Fatih Kocan , Daniel G. Saab, Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware, Journal of Electronic Testing: Theory and Applications, v.23 n.5, p.405-420, October 2007
	Yu-Ru Hong , Juinn-Dar Huang, Reducing fault dictionary size for million-gate large circuits, ACM Transactions on Design Automation of Electronic Systems (TODAES), v.14 n.2, p.1-14, March 2009