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A massively-parallel easily-scalable satisfiability solver using reconfigurable hardware
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference table of contents
New Orleans, Louisiana, United States
Pages: 684 - 690  
Year of Publication: 1999
ISBN:1-58133-109-7
Authors
Miron Abramovici  Bell Labs - Lucent Technologies, Murray Hill, NJ
Jose T. de Sousa  Bell Labs - Lucent Technologies, Murray Hill, NJ
Daniel Saab  Case Western Reserve University, Cleveland, Ohio
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 26,   Citation Count: 5
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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S. Devadas, "Optimal Layout Via Boolean Satisfiability," Proc. Intn' I. Conf. on CAD, pp. 294-297, November 1989
 
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DIMACS Challenge Benchmarks, ftp://dimacs.rutg ers.edu/p ub/ chal len g e/ sat/ benchmarks/ cnf/
 
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H. Fujiwara and T. Shimono, "On the Acceleration of Test Generation Algorithms," IEEE Trans. on Computers, vol. C-32, no 12, pp. 1137-1144, December, 1983.
 
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P. Goel, "An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits," IEEE Trans. on Computers, Vol. C-30, No. 3, pp. 215-222, March, 1981.
 
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J. Gu, "Satisfiability Problems in VLSI Engineering," DIMACS Workshop on Satisfiability Problem: Theory and Applications, March 1996
 
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J. Gu, E W. Purdom, J. Franco, and B. W. Wah, "Algorithms for the Satisfiability (SAT) Problem: A Survey," DIMACS Workshop on Satisfiability Problem: Theory and Applications, pp. 19-51, March 1996
 
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J. Gu and R. Puri, "Asynchronous Circuit Synthesis with Boolean Satisfiability", IEEE Trans. on CAD, Vol. 14, No. 8, pp. 961-973, August 1995
 
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T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability," IEEE Trans. on CAD, Vol. 11, No. 1, pp. 4-15, January, 1992
 
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P. C. McGeer et al., "Timing Analysis and Delay-Fault Test Generation Using Path Recursive Functions," Proc. Intn' 1. Conf. on CAD, pp. 180-183, November 1991
 
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J. M. Silva, "An Overview of Backtrack Search Satisfiability Algorithms," Proc. 5th Intn' 1. Symp. on Artificial Intelligence and Mathematics, January 1998
 
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L. G. Silva et al., "Realistic Delay Modeling in Satisfiability-Based Timing Analysis," Proc. Intn' 1. Symp. on Circuits and Systems (ISCAS), May 1998
 
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P. R. Stephan, R. K. Brayton, and A. Sangiovanni-Vincentelli, "Combinational Test Generation Using Satisfiability," IEEE Trans. on CAD, vol. 15, no. 9, pp. 1167-1176, Sept. 1996.
 
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Collaborative Colleagues:
Miron Abramovici: colleagues
Jose T. de Sousa: colleagues
Daniel Saab: colleagues