ACM Home Page
Please provide us with feedback. Feedback
Stand-by power minimization through simultaneous threshold voltage selection and circuit sizing
Full text PdfPdf (92 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference table of contents
New Orleans, Louisiana, United States
Pages: 436 - 441  
Year of Publication: 1999
ISBN:1-58133-109-7
Authors
Supamas Sirichotiyakul  Advanced Tools, Motorola Inc., Austin, TX
Tim Edwards  Advanced Tools, Motorola Inc., Austin, TX
Chanhee Oh  Advanced Tools, Motorola Inc., Austin, TX
Jingyan Zuo  Advanced Tools, Motorola Inc., Austin, TX
Abhijit Dharchoudhury  Advanced Tools, Motorola Inc., Austin, TX
Rajendran Panda  Advanced Tools, Motorola Inc., Austin, TX
David Blaauw  Advanced Tools, Motorola Inc., Austin, TX
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 40,   Citation Count: 39
Additional Information:

references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/309847.309975
What is a DOI?

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
N. Rohrer, et al. "A 480MHz RISC microprocessor in a 0.12 um Left CMOS technology with copper interconnects", IEEE International Solid-State Circuits Conference, 1998.
 
2
Y. Oowaki, et al., "A Sub-0.1um Circuit Design with Substrate-over-Biasing", ISSCC, page 88, February 1998.
3
4
5
6
 
7
J. Halter and EN. Najm, "A gate-level leakage power reduction method for ultra-low-power CMOS circuits," Custom Integrated Circuit Conference, 1997.
8
 
9
S.Ercolani, M.Favalli, M.Damiani, EOlivo, B.Ricco. "Testability Measures in Pseudorandom Testing", IEEE Trans. on CAD, 1992, v.11, n.6, pp.794-800.
 
10
J.E Fishburn, et al., "TILOS: A posynomial programming approach to transistor sizing," ICCAD, Nov 1985
 
11
 
12
A. Dharchoudhury, et. al., "Transistor-level sizing and timing verification of domino circuits in the PowerPCTM microprocessor," ICCD, October 1997.

CITED BY  39

Collaborative Colleagues:
Supamas Sirichotiyakul: colleagues
Tim Edwards: colleagues
Chanhee Oh: colleagues
Jingyan Zuo: colleagues
Abhijit Dharchoudhury: colleagues
Rajendran Panda: colleagues
David Blaauw: colleagues