| Enhancing simulation with BDDs and ATPG |
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Annual ACM IEEE Design Automation Conference
archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
table of contents
New Orleans, Louisiana, United States
Pages: 385 - 390
Year of Publication: 1999
ISBN:1-58133-109-7
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Authors
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Malay K. Ganai
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Electrical and Computer Engineering, The University of Texas at Austin
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Adnan Aziz
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Electrical and Computer Engineering, The University of Texas at Austin
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Andreas Kuehlmann
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IBM Thomas J. Watson Research Center, Yorktown Heights, NY
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Downloads (6 Weeks): 2, Downloads (12 Months): 8, Citation Count: 21
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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Srinivas Devadas , Abhijit Ghosh , Kurt Keutzer, An observability-based code coverage metric for functional simulation, Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design, p.418-425, November 10-14, 1996, San Jose, California, United States
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A. El-Maleh, T. Marchok, J. Rajski, and W. Maly. Behavior and Testability Preservation Under the Retiming Transformation. IEEE Transactions on Computer-Aided Design of Integrated Circuit, May 1997.
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Daniel Geist , Monica Farkas , Avner Landver , Yossi Lichtenstein , Shmuel Ur , Yaron Wolfsthal, Coverage-Directed Test Generation Using Symbolic Techniques, Proceedings of the First International Conference on Formal Methods in Computer-Aided Design, p.143-158, November 06-08, 1996
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Woohyuk Lee , Abelardo Pardo , Jae-Young Jang , Gary Hachtel , Fabio Somenzi, Tearing based automatic abstraction for CTL model checking, Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design, p.76-81, November 10-14, 1996, San Jose, California, United States
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R. Mukherjee, J. Jain, K. Takayama, M. Fujita, J. A. Abraham, and D. S. Fussell. Efficient Combination Verification Using Cuts and Overlapping BDDs. In Proc. intl. Workshop on Logic Synthesis, May 1997.
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P. Stephan, R. K. Brayton, and A. L. Sangiovanni-Vincentelli. Combination Test Generation using Satisfiability. IEEE Transactions on Computer-Aided Design of Integrated Circuits, September 1996.
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Dong Xiang , Srikanth Venkataraman , W. Kent Fuchs , Janak H. Patel, Partial scan design based on circuit state information, Proceedings of the 33rd annual conference on Design automation, p.807-812, June 03-07, 1996, Las Vegas, Nevada, United States
[doi> 10.1145/240518.240670]
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UC Berkeley. mlv.cad.eecs.bsrkslsy.sdu/'vis.
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CITED BY 21
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Praveen Yalagandula , Vigyan Singhal , Adnan Aziz, Automatic lighthouse generation for directed state space search, Proceedings of the conference on Design, automation and test in Europe, p.237-242, March 27-30, 2000, Paris, France
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Pei Hsin Ho , Thomas Shiple , Kevin Harer , James Kukula , Robert Damiano , Valeria Bertacco , Jerry Taylor , Jiang Long, Smart simulation using collaborative formal and simulation engines, Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design, November 05-09, 2000, San Jose, California
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Yu-Chin Hsu , Bassam Tabbara , Yirng-An Chen , Furshing Tsai, Advanced techniques for RTL debugging, Proceedings of the 40th conference on Design automation, June 02-06, 2003, Anaheim, CA, USA
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Yu-Chin Hsu , Furshing Tsai , Wells Jong , Ying-Tsai Chang, Visibility enhancement for silicon debug, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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