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Coverage estimation for symbolic model checking
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference table of contents
New Orleans, Louisiana, United States
Pages: 300 - 305  
Year of Publication: 1999
ISBN:1-58133-109-7
Authors
Yatin Hoskote  Strategic CAD Labs, Design Technology, Intel Corp.
Timothy Kam  Strategic CAD Labs, Design Technology, Intel Corp.
Pei-Hsin Ho  Advanced Technology Group, Synopsys, Inc.
Xudong Zhao  Strategic CAD Labs, Design Technology, Intel Corp.
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 6,   Downloads (12 Months): 15,   Citation Count: 25
Additional Information:

references   cited by   index terms   collaborative colleagues  

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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H. Cho, G. Hachtel, F. Somenzi, "Redundancy Identification and Test Generation for Sequential Circuits Using Implicit State Enumeration," IEEE Transactions on CAD, vol 12, no. 7, pp. 935-945, 1993
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CITED BY  25

Collaborative Colleagues:
Yatin Hoskote: colleagues
Timothy Kam: colleagues
Pei-Hsin Ho: colleagues
Xudong Zhao: colleagues