Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
H. Cho, G. Hachtel, F. Somenzi, "Redundancy Identification and Test Generation for Sequential Circuits Using Implicit State Enumeration," IEEE Transactions on CAD, vol 12, no. 7, pp. 935-945, 1993