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Model order-reduction of RC(L) interconnect including variational analysis
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference table of contents
New Orleans, Louisiana, United States
Pages: 201 - 206  
Year of Publication: 1999
ISBN:1-58133-109-7
Authors
Ying Liu  Department of Electrical and Computer Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA
Lawrence T. Pileggi  Department of Electrical and Computer Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA
Andrzej J. Strojwas  Department of Electrical and Computer Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA
Sponsors
EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 15,   Downloads (12 Months): 62,   Citation Count: 30
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Boning, D.S. and J.E. Chung, "Statistical metrology-measurement and modeling of variation for advanced process development and design rule generation", Proc. 1998 Int. Conf. on Characterization and Metrology for ULSI Technology, March 1998.
 
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3
Feldmann, E and R.W. Fruend, "Efficient linear circuit analysis by Pad6 approximation via the Lanczos process", IEEE Trans. CAD, vol. 14, May 1995.
 
4
 
5
Harkness, C.L. and D.E Lopresti, "Interval methods for modeling uncertainty in RC timing analysis", IEEE Trans. CAD, vol. 11, No. 11, November 1992.
 
6
Kato, T., Perturbation theory for linear operator, 2nd ed., Springer-Verlag, 1995.
 
7
Kemble, E.C., The fundamental principles of quantum mechanics, Dover, 1958.
 
8
Kerns, K.J. and A.T. Yang, "Stable and efficient reduction of large, multiport RC networks by pole analysis via congruence transformations", IEEE Trans. CAD, vol. 16, 1997.
 
9
Odabasioglu, A., M. Celik and L.T. Pileggi, "PRIMA: passive reduced-order interconnect macromodeling algorithm", IEEE Trans. CAD, August 1998.
 
10
Pillage, L.T. and R.A. Rohrer, "Asymptotic waveform evaluation for timing analysis", IEEE Trans. CAD, vol. 9, April 1990.
 
11
Progler, C., H. Du and G. Wells, "Potential causes of across field CD variation", SPIE, vol. 3051, 1997.
 
12
Rubinstein, J., E Penfield Jr. and M.A. Horowitz, "Signal delay in RC tree networks", IEEE Trans. CAD, vol. CAD-2, July 1983.
13
 
14
Stewart, G.W. and J.-G. Sun, Matrix perturbation theo~7, Academic Press, Inc., San Diego, 1990
 
15
Stine, B.E. et al, "The physical and electrical effects of metal filling patterning practices for oxide chemical mechanical polishing processes", IEEE Trans. Electron Devices, vol. 45, No. 3, March 1998.
 
16
Stine, B.E. et al, "Rapid characterization and modeling of spatial variation: a CMP case study", CMP Metrology Session, Semicon West '97, July 1997.

CITED BY  30

Collaborative Colleagues:
Ying Liu: colleagues
Lawrence T. Pileggi: colleagues
Andrzej J. Strojwas: colleagues