High-level test generation for design verification of pipelined microprocessors

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High-level test generation for design verification of pipelined microprocessors

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 36th annual ACM/IEEE Design Automation Conference table of contents

New Orleans, Louisiana, United States

Pages: 185 - 188

Year of Publication: 1999

ISBN:1-58133-109-7

Authors

David Van Campenhout	Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI
Trevor Mudge	Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI
John P. Hayes	Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI

Sponsors

EDAC : Electronic Design Automation Consortium
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 6, Downloads (12 Months): 19, Citation Count: 15

Additional Information:

references cited by index terms collaborative colleagues

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY 15

	Tao Lv , Jian-Ping Fan , Xiao-Wei Li , Ling-Yi Liu, Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional Verification, Journal of Electronic Testing: Theory and Applications, v.22 n.3, p.273-285, June 2006
	F. Corno , G. Cumani , M. Sonza Reorda , G. Squillero, Automatic test program generation for pipelined processors, Proceedings of the 2003 ACM symposium on Applied computing, March 09-12, 2003, Melbourne, Florida
	F. Corno , E. Sanchez , M. Sonza Reorda , G. Squillero, Code Generation for Functional Validation of Pipelined Microprocessors, Journal of Electronic Testing: Theory and Applications, v.20 n.3, p.269-278, June 2004
	Fulvio Corno , Ernesto Sánchez , Matteo Sonza Reorda , Giovanni Squillero, Automatic Test Program Generation: A Case Study, IEEE Design & Test, v.21 n.2, p.102-109, March 2004
	Allon Adir , Hezi Azatchi , Eyal Bin , Ofer Peled , Kirill Shoikhet, A generic micro-architectural test plan approach for microprocessor verification, Proceedings of the 42nd annual conference on Design automation, June 13-17, 2005, San Diego, California, USA
	Serdar Tasiran , Kurt Keutzer, Coverage Metrics for Functional Validation of Hardware Designs, IEEE Design & Test, v.18 n.4, p.36-45, July 2001
	Heon-Mo Koo , Prabhat Mishra, Functional test generation using property decompositions for validation of pipelined processors, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
	Giovanni Squillero, MicroGP—An Evolutionary Assembly Program Generator, Genetic Programming and Evolvable Machines, v.6 n.3, p.247-263, September 2005
	Prabhat Mishra , Nikil Dutt, Functional Coverage Driven Test Generation for Validation of Pipelined Processors, Proceedings of the conference on Design, Automation and Test in Europe, p.678-683, March 07-11, 2005
	O. Goloubeva , M. Sonza Reorda , M. Violante, Automatic Generation of Validation Stimuli for Application-Specific Processors, Proceedings of the conference on Design, automation and test in Europe, p.10188, February 16-20, 2004
	Prabhat Mishra , Nikil Dutt, Graph-Based Functional Test Program Generation for Pipelined Processors, Proceedings of the conference on Design, automation and test in Europe, p.10182, February 16-20, 2004
	Heon-Mo Koo , Prabhat Mishra, Specification-based compaction of directed tests for functional validation of pipelined processors, Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis, October 19-24, 2008, Atlanta, GA, USA
	Prabhat Mishra , Nikil Dutt, Specification-driven directed test generation for validation of pipelined processors, ACM Transactions on Design Automation of Electronic Systems (TODAES), v.13 n.3, p.1-36, July 2008
	V. V. Belkin, Testing diagnostics of modern microprocessors with the use of functional models, Automation and Remote Control, v.69 n.8, p.1398-1410, August 2008
	Heon-Mo Koo , Prabhat Mishra, Functional test generation using design and property decomposition techniques, ACM Transactions on Embedded Computing Systems (TECS), v.8 n.4, p.1-33, July 2009