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Algorithms for solving Boolean satisfiability in combinational circuits
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Munich, Germany
Article No. 107  
Year of Publication: 1999
ISBN:1-58113-121-6
Authors
Luís Guerra e Silva  Cadence European Labs/INESC, Instituto Superior Técnico, Liboa, Portugal
L. Miguel Silveira  Cadence European Labs/INESC, Instituto Superior Técnico, Liboa, Portugal
Joöa Marques-Silva  Cadence European Labs/INESC, Instituto Superior Técnico, Liboa, Portugal
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 1,   Downloads (12 Months): 10,   Citation Count: 8
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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[1] M. Abramovici, M. A. Breuer and A. D. Friedman, Digital Systems Testing and Testable Design, Computer Science Press, 1990.
 
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[2] P. Barth, "A Davis-Putnam Enumeration Algorithm for Linear pseudo-Boolean Optimization," Technical Report MPI-I-95-2-003, Max Planck Institute for Computer Science, 1995.
 
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[3] R. Bayardo Jr. and R. Schrag, "Using CSP Look-Back Techniques to Solve Real-World SAT Instances," in Proc. of the Nat'l Conf. on Artificial Intelligence, pp. 203-208, July 1997.
 
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[4] F. Brglez and H. Fujiwara, "A Neutral List of 10 Combinational Benchmark Circuits and a Target Translator in FORTRAN," in Proc. of the Int'l Symp. on Circuits and Systems, 1985.
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[7] S. Devadas, K. Keutzer and S. Malik, "Computation of Floating Mode Delay in Combinational Circuits: Practice and Implementation," IEEE Trans. on Computer Aided Design of Integrated Circuits and Systems, vol. 12 no. 12, pp. 1923-1936, December 1993.
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[11] R. Fuhrer and S. Nowick, "Exact Optimal State Minimization for 2- Level Output Logic," in Int'l Workshop on Logic Synthesis, June 1998.
 
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[12] L. Guerra e Silva, J. Marques-Silva, L. M. Silveira and K. A. Sakallah, "Satisfiability Models and Algorithms for Circuit Delay Computation," in Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU), December 1997.
 
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[15] T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability," IEEE Trans. on Computer-Aided Design, vol. 11, no. 1, pp. 4-15, January 1992.
 
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[18] P. McGeer, A. Saldanha, P. R. Stephan, R. K. Brayton and A. L. Sangiovanni-Vincentelli, "Timing Analysis and Delay-Test Generation Using Path Recursive Functions," in Proc. of the Int'l Conf. on Computer-Aided Design, pp. 180-183, November 1991.
 
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[19] P. Stephan, R. K. Brayton and A. L. Sangiovanni-Vincentelli, "Combinatorial Test Generation Using Satisfiability", IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 15, no. 9, September 1996.
 
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CITED BY  8

Collaborative Colleagues:
Luís Guerra e Silva: colleagues
L. Miguel Silveira: colleagues
Joöa Marques-Silva: colleagues