Efficient techniques for accurate extraction and modeling of substrate coupling in mixed-signal IC's

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Efficient techniques for accurate extraction and modeling of substrate coupling in mixed-signal IC's

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Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents

Munich, Germany

Article No. 84

Year of Publication: 1999

ISBN:1-58113-121-6

Authors

João Paulo Costa	INESC/Cadence European Laboratories, Department of Electrical and Computer Engineering, Instituto Superior Técnico, Lisboa, Portugal
Mike Chou	Research Laboratory of Electronics, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA
L. Miguel Silveira	Cadence European Laboratories, Department of Electrical and Computer Engineering, Instituto Superior Técnico, Lisboa, Portugal

Sponsor

SIGDA: ACM Special Interest Group on Design Automation

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ACM New York, NY, USA

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Downloads (6 Weeks): 2, Downloads (12 Months): 17, Citation Count: 2

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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	12	J.-P. Costa , M. Chou , L. M. Silveira, Efficient techniques for accurate modeling and simulation of substrate coupling in mixed-signal IC's, Proceedings of the conference on Design, automation and test in Europe, p.892-898, February 23-26, 1998, Le Palais des Congrés de Paris, France
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	19	Mike Chou , Jacob White, Multilevel integral equation methods for the extraction of substrate coupling parameters in mixed-signal IC's, Proceedings of the 35th annual conference on Design automation, p.20-25, June 15-19, 1998, San Francisco, California, United States [doi>10.1145/277044.277049]
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CITED BY 2

	Mike Chou , Jacob White, Multilevel integral equation methods for the extraction of substrate coupling parameters in mixed-signal IC's, Proceedings of the 35th annual conference on Design automation, p.20-25, June 15-19, 1998, San Francisco, California, United States
	Luis Miguel Silveira , Nuno Vargas, Characterizing Substrate Coupling in Deep-Submicron Designs, IEEE Design & Test, v.19 n.2, p.4-15, March 2002