| Synthesis of controllers for full testability of integrated datapath-controller pairs |
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Design, Automation, and Test in Europe
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Proceedings of the conference on Design, automation and test in Europe
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Munich, Germany
Article No. 58
Year of Publication: 1999
ISBN:1-58113-121-6
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Authors
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Joan Carletta
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Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH
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Mehrdad Nourani
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Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH
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Christos Papachristou
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Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH
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Downloads (6 Weeks): n/a, Downloads (12 Months): n/a, Citation Count: 2
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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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R. A. Bergamaschi , D. Lobo , A. Kuehlmann, Control optimization in high-level synthesis using behavioral don't cares, Proceedings of the 29th ACM/IEEE conference on Design automation, p.657-661, June 08-12, 1992, Anaheim, California, United States
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[2] D. Brand, R. Bergamaschi and L. Stok, "Don't Cares in Synthesis: Theoretical Pitfalls and Practical Solutions," IEEE Trans. on CAD, April 1998, pp. 285-304.
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[3] Compass Design Automation, "User Manuals for COMPASS VLSI V8R4.4," Compass Design Automation, Inc., 1993.
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[6] S. Dey, V. Gangaram and M. Potkonjak, "A Controller-Based Design-for-Testability Technique for Controller-Datapath Circuits," Proc. Int'l. Test Conf., October 1995.
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[9] AT&T, "UserManuals for GENTEST_S 2.0," AT&T Bell Laboratories, 1993.
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H. Harmanani , C. Papachristou , S. Chiu , M. Nourani, SYNTEST: an environment for system-level design for test, Proceedings of the conference on European design automation, p.402-407, November 1992, Congress Centrum Hamburg, Hamburg, Germany
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[11] A. Hertwig and H. Wunderlich, "Fast Controllers for Data Dominated Applications," Proc. Int'l. Test Conf., 1997.
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Youpyo Hong , Peter A. Beerel , Jerry R. Burch , Kenneth L. McMillan, Safe BDD minimization using don't cares, Proceedings of the 34th annual conference on Design automation, p.208-213, June 09-13, 1997, Anaheim, California, United States
[doi> 10.1145/266021.266068]
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M. Nourani , J. Carletta , C. Papachristou, A scheme for integrated controller-datapath fault testing, Proceedings of the 34th annual conference on Design automation, p.546-551, June 09-13, 1997, Anaheim, California, United States
[doi> 10.1145/266021.266280]
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CITED BY 2
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Mehrdad Nourani , Joan Carletta , Christos Papachristou, Synthesis-for-testability of controller-datapath pairs that use gated clocks, Proceedings of the 37th conference on Design automation, p.613-618, June 05-09, 2000, Los Angeles, California, United States
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