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Synthesis of controllers for full testability of integrated datapath-controller pairs
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Source Design, Automation, and Test in Europe archive
Proceedings of the conference on Design, automation and test in Europe table of contents
Munich, Germany
Article No. 58  
Year of Publication: 1999
ISBN:1-58113-121-6
Authors
Joan Carletta  Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH
Mehrdad Nourani  Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH
Christos Papachristou  Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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[2] D. Brand, R. Bergamaschi and L. Stok, "Don't Cares in Synthesis: Theoretical Pitfalls and Practical Solutions," IEEE Trans. on CAD, April 1998, pp. 285-304.
 
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[3] Compass Design Automation, "User Manuals for COMPASS VLSI V8R4.4," Compass Design Automation, Inc., 1993.
 
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[6] S. Dey, V. Gangaram and M. Potkonjak, "A Controller-Based Design-for-Testability Technique for Controller-Datapath Circuits," Proc. Int'l. Test Conf., October 1995.
 
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[9] AT&T, "UserManuals for GENTEST_S 2.0," AT&T Bell Laboratories, 1993.
 
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[11] A. Hertwig and H. Wunderlich, "Fast Controllers for Data Dominated Applications," Proc. Int'l. Test Conf., 1997.
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Collaborative Colleagues:
Joan Carletta: colleagues
Mehrdad Nourani: colleagues
Christos Papachristou: colleagues